A system and method for quality inspection of the whole process of printing and manufacturing display devices
A technology for display devices and the whole process, applied in semiconductor/solid-state device manufacturing, instruments, printing, etc., can solve the problems of not involving liquid film detection scheme, adjustment, and no problem, and achieve the effect of easy defect analysis and accurate detection
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[0099] In order to make the objectives, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.
[0100] figure 1 It is a schematic diagram of the composition of the overall system constructed according to the present invention for quality inspection of the whole process of jet printing and manufacturing of display devices. like figure 1 As shown, the system according to the present invention mainly includes a substrate detection module, a nozzle detection module, an ink drop detection module, a film thickness detection module and a control module.
[0101] First of all, for the substrate detection module, it includes a large-view down-view unit 12, a high-magnification down-view uni...
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