Method for measuring residual stress of polycrystalline material in X-ray diffraction full-spectrum multi-peak fitting mode

A polycrystalline material and residual stress technology, applied in the field of analysis and testing, can solve problems such as errors and achieve the effect of avoiding influence

Pending Publication Date: 2021-04-30
宁波经略海洋科技有限公司
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Problems solved by technology

P.J.Withers et al. published " "Overview-Residualstress Part 1-Measurmenttechniques" paper summarizes the method and shortcomings of X-ray diffraction method for measuring residual stress. If there is texture in the material, the result of traditional X-ray diffraction method for measuring residual stress will produce large errors

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  • Method for measuring residual stress of polycrystalline material in X-ray diffraction full-spectrum multi-peak fitting mode
  • Method for measuring residual stress of polycrystalline material in X-ray diffraction full-spectrum multi-peak fitting mode
  • Method for measuring residual stress of polycrystalline material in X-ray diffraction full-spectrum multi-peak fitting mode

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specific Embodiment

[0047] The polycrystalline material sample is 304 austenitic stainless steel, the sample size is 20mm×20mm×5mm, and it is divided into three groups. Using pneumatic shot blasting machine and The high-strength steel wire cut shot, the surface of the sample is shot peened, and the three groups of shot peening intensity (indicated by the arc height value of the A-type Almen test piece) are: 0.30mm, 0.35mm, 0.40mm.

[0048] Material X-ray Diffraction Full Spectrum Measurement Parameter Setting

[0049] Such as figure 1 As shown, the specific X-ray diffractometer measurement parameters in the experiment are tube voltage: 40kV, tube current: 30mA, Cu-K α For radiation, the scanning speed is 2° / min, the scanning step is 0.01°, and the scanning range is set to 35°-100°.

[0050] X-ray diffraction lines of 304 austenitic stainless steel with different shot peening intensities were obtained by X-ray diffractometer.

[0051] Using a diffractometer (Rigaku UltimaⅣ), according to the te...

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Abstract

The invention provides a method for measuring residual stress of a polycrystalline material in an X-ray diffraction full-spectrum multi-peak fitting mode. The method comprises the following steps: obtaining plane strain of a polycrystalline material by utilizing an X-ray diffraction full-spectrum spectral line of the material and adopting a multi-peak fitting mode on the basis of considering polycrystalline grain orientation, and combining the stress-strain relationship of the polycrystalline material on the basis, and finally calculating the residual stress value of the polycrystalline material. According to the method, multiple pieces of diffraction peak information are adopted in the material strain calculation process, the grain orientation of the polycrystalline material is considered, the influence of preferred orientation of the polycrystalline material on a traditional X-ray diffraction stress analysis method is avoided, and the convenient and rapid method is provided for measuring the residual stress of the polycrystalline material.

Description

technical field [0001] The invention relates to the technical field of analysis and testing, in particular to a method for measuring residual stress of polycrystalline materials in X-ray diffraction full-spectrum multi-peak fitting mode. Background technique [0002] During the production, handling or processing of materials, residual stresses are generated in materials due to inhomogeneous deformation of local areas of materials. Appropriate residual stress distribution can be a favorable factor to improve the performance of materials. For example, through shot peening technology, a residual compressive stress field is formed on the surface of the metal workpiece, which can effectively improve the service life of the workpiece. Therefore, in order to make better use of residual stress to optimize material performance, it is necessary to detect and control the residual stress of materials in each process of production. [0003] X-ray diffraction technology has a relatively...

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Application Information

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IPC IPC(8): G01L5/00G01N23/2055
CPCG01L5/0047G01N23/2055G01N2223/0568G01N2223/0566G01N2223/1016G01N2223/607
Inventor 汪选国汪研张林海方海英万才明许建艳吴芳
Owner 宁波经略海洋科技有限公司
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