In-situ characterization method of bonding interface state under irradiation condition
A bonding and interface technology, applied in the direction of material excitation analysis, etc., can solve problems such as difficulty in long-term use, insufficient convenience of use, and high requirements for personnel protection, and achieve the effect of meeting long-term use and simple characterization methods
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[0032] The present invention will be further described below in conjunction with embodiment.
[0033] An in-situ characterization method of the bonded interface state under irradiation conditions, comprising the following steps:
[0034] 1) Sampling of bonding interface
[0035] Referring to the research conclusions such as the failure mechanism and degradation law of the target bonding interface, cut and sample the typical state parts of the bonding interface of the real component after irradiation, and use the samples taken to prepare the certificate in the typical state. The sampling process must not introduce For failure modes other than radiation failure mechanism, the number of certificates is recorded as n, and each piece is numbered 1, 2, ... n, where n≥3, preferably n≥5;
[0036] 2) Typical state of calibration
[0037] 2.1) Signal analysis based on laser-induced transient grating spectroscopy
[0038] Use the laser-induced transient grating to irradiate the form c...
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