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Appearance defect detection method and device for industrial product and storage medium

A technology for appearance defects and industrial products, applied in the field of industrial appearance inspection, can solve the problems of low detection success rate, low detection accuracy, insufficient detection feature extraction, etc., to achieve high-precision detection and improve detection accuracy.

Pending Publication Date: 2021-03-30
BEIJING UNIV OF POSTS & TELECOMM
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] 1. Manual detection has high cost, low efficiency, low detection accuracy and unstable detection results
[0005] 2. The existing intelligent detection model based on deep learning requires a large number of samples for model training, but the number of defective samples of industrial products is often very small. In the case of insufficient or few samples, the model training cannot be successful, resulting in subsequent The detection success rate is very low
[0006] 3. When the intelligent detection based on deep learning is directly used in industrial detection, due to the single detection background and insufficient detection feature extraction, it cannot be accurately identified, resulting in low detection accuracy

Method used

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  • Appearance defect detection method and device for industrial product and storage medium
  • Appearance defect detection method and device for industrial product and storage medium
  • Appearance defect detection method and device for industrial product and storage medium

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Experimental program
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Embodiment 1

[0024] According to this embodiment, an embodiment of a method for detecting appearance defects of industrial products is provided. It should be noted that the steps shown in the flow charts of the drawings can be executed in a computer system such as a set of computer-executable instructions, Also, although a logical order is shown in the flowcharts, in some cases the steps shown or described may be performed in an order different from that shown or described herein.

[0025] The method embodiments provided in this embodiment can be executed in a server or similar computing devices. figure 1 A block diagram of a hardware structure of a computing device for implementing a method for detecting an appearance defect of an industrial product is shown. Such as figure 1 As shown, the computing device may include one or more processors (processors may include but not limited to processing devices such as microprocessors MCUs or programmable logic devices FPGAs), memory for storing d...

Embodiment 2

[0123] Figure 6 A device 600 for detecting appearance defects of industrial products according to this embodiment is shown, and the device 600 corresponds to the method according to the first aspect of Embodiment 1. refer to Figure 6 As shown, the device 600 includes: an appearance image acquisition module 610 for obtaining an appearance image of an industrial product to be inspected; an appearance defect detection module 620 for using a pre-trained appearance defect detection model based on the appearance image to detect industrial products Perform appearance defect detection, wherein the appearance defect detection device also includes a training module 630, which is used to train the appearance defect detection model through the following submodules: a sample image acquisition submodule, used to obtain multiple samples of sample industrial products with appearance defects Image; the first generation submodule is used to perform data enhancement on a plurality of sample i...

Embodiment 3

[0132] Figure 7 A device 700 for detecting appearance defects of industrial products according to this embodiment is shown, and the device 700 corresponds to the method according to the first aspect of Embodiment 1. refer to Figure 7 As shown, the device 700 includes: a processor 710; and a memory 720, connected to the processor 710, used to provide the processor 710 with instructions for processing the following processing steps: obtaining an appearance image of the industrial product to be inspected; based on the appearance image , using the pre-trained appearance defect detection model to detect the appearance defects of industrial products, wherein the appearance defect detection model is trained by the following operations: obtaining multiple sample images of sample industrial products with appearance defects; using the preset data transformation The rule is to perform data enhancement on multiple sample images to generate a first sample image set; based on the first s...

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Abstract

The invention discloses an appearance defect detection method and device for an industrial product and a storage medium. The appearance defect detection method for the industrial product comprises thefollowing steps: acquiring an appearance image of the industrial product to be detected; based on the appearance images, performing appearance defect detection on the industrial product through a pre-trained appearance defect detection model, and training the appearance defect detection model through the following operations: obtaining multiple sample images of a sample industrial product with appearance defects; performing data enhancement on the plurality of sample images by adopting a preset data transformation rule to generate a first sample image set; based on the first sample image set,generating a second sample image set by using a preset DCGAN model; and training an appearance defect detection model by using the second sample image set.

Description

technical field [0001] The present application relates to the technical field of industrial appearance inspection, in particular to an appearance defect inspection method, device and storage medium of industrial products. Background technique [0002] In the field of industrial inspection, appearance inspection is an important content. The quality of appearance affects the quality of products to a certain extent. At present, the degree of automation of appearance inspection is low, and most of them rely on manual inspection. Even in a small amount of inspections that use image processing There are also certain defects in the automation equipment. [0003] The current industrial testing mainly has the following problems: [0004] 1. Manual detection has high cost, low efficiency, low detection accuracy and unstable detection results. [0005] 2. The existing intelligent detection model based on deep learning requires a large number of samples for model training, but the num...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/10G06N3/04G06N3/08
CPCG06T7/0004G06T7/10G06N3/08G06N3/045
Inventor 刘刚李雷远何沐宸钱程远白山于雯婷朱朋飞
Owner BEIJING UNIV OF POSTS & TELECOMM
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