Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Fitting method for solar cell IV curve

A solar cell and curve technology, applied in the field of IV curve fitting, can solve problems such as low fitting accuracy, oscillating fitting curves, complex algorithms, etc., achieve high fitting accuracy and avoid oscillating effects

Active Publication Date: 2021-03-19
中电科思仪科技(安徽)有限公司
View PDF9 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The currently used fitting algorithms include exponential function analysis method, pseudo-Monte Carlo algorithm, etc., but because these algorithms have certain defects, or the fitting accuracy is low, or the algorithm is complex, etc., polynomial fitting is mostly used in engineering applications. However, the defect of the polynomial fitting algorithm is that the fitting accuracy is related to the order of the polynomial, and at the same time, the fitting curve is prone to oscillation.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Fitting method for solar cell IV curve
  • Fitting method for solar cell IV curve
  • Fitting method for solar cell IV curve

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0034] The (I, V) data set of the solar cell under the illumination condition collected by the test circuit is a set of discrete data, such as image 3 indicated by the dot in the middle. In order to obtain a smooth I-V curve, polynomial fitting is usually used in engineering to achieve curve fitting. The following formula (5) is for image 3 The 14th-order polynomial fitting function used by the discrete data points in (the 14th-order polynomial fitting function is used because the fitting accuracy of the 14th-order basically meets the engineering requirements), the fitting curve is as follows image 3 shown in the middle curve. figure 2 The list in lists the collected (I, V) data and the current data after the 14th order polynomial fitting.

[0035]

[0036] Among them, V i The value is the original collected voltage value, Inewi is the fitted current value, and the value of i is 1 to the total points collected.

[0037] from image 3 It can be seen that the error ...

Embodiment 2

[0039] But for some (I, V) collected data, only using a single polynomial fitting function is likely to cause the oscillation of the fitting curve, such as Figure 5 shown. Figure 5 The dots in the middle are the original collected data, and the curve is the fitting curve after using the 14th-order polynomial fitting function for the whole data segment data, and the fitting function is shown in formula (6). Figure 4 The list in lists the collected (I, V) data and the current data after the 14th order polynomial fitting.

[0040]

[0041] Among them, V i The value is the original collected voltage value, Inewi is the fitted current value, and the value of i is 1 to the total points collected.

[0042] from Figure 5 It can be seen that the curve fitted by a single polynomial appears to oscillate.

[0043] Utilize the multi-section composite function fitting method of the present invention to Figure 4 The curve after the piecewise fitting of the original collected dat...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a fitting method for a solar cell IV curve, and belongs to the field of IV curve fitting. According to the method for obtaining the IV fitting curve of the solar cell, fittingof discrete I and V data originally collected by the solar cell is achieved through a multi-segment composite function, corresponding fitting functions are obtained by setting different data segments,then the functions are combined together and an integrated smooth I-V data curve is obtained. Not only can a test curve with high fitting precision be obtained, but also the phenomenon of oscillationof the fitting curve can be effectively avoided.

Description

technical field [0001] The invention belongs to the field of IV curve fitting, in particular to a method for fitting the IV curve of a solar battery. Background technique [0002] The solar cell model is a typical nonlinear transcendental function, and it is difficult to solve the characteristic parameters of the solar cell through this function. In engineering, the characteristic parameters of solar cells are analyzed by collecting (I, V) data of a group of solar cells. However, the (I, V) data collected by the test circuit is a set of discrete test data. At the same time, due to the noise of the test circuit, the collected data is inevitably mixed with noise data, resulting in deviation and fluctuation of the test data. In order to obtain a smooth I-V data curve, a curve fitting method is usually used to obtain a smooth curve, so that it can not only best fit the collected data, but also avoid and reduce the fluctuation and noise of the collected data. The currently used...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/10
CPCG06F17/10
Inventor 毛翌春朱炬年夫来周康
Owner 中电科思仪科技(安徽)有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com