Aging screening test system and method for laser diode array

A laser diode and aging screening technology, applied in the direction of optical testing flaws/defects, testing optical performance, environment/reliability testing, etc., to achieve the effect of eliminating early failure and high integration

Active Publication Date: 2021-03-02
BEIJING RES INST OF TELEMETRY +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The present invention aims to solve the screening problem of laser diode arrays used in the space-borne field, and provides an aging screening test system and method for laser diode arrays, including near-field light-emitting point testing, far-field divergence angle testing, electro-optic characteristic testing, and spectral testing. , Mirror inspection test function and test screening of laser diode array after aging, realize the full parameter screening test of laser diode array, and through the aging test, the electro-optic characteristics, spectrum, far-field, near-field luminous point of the laser diode array before and after aging And the microscopic inspection of the film layer on the light-emitting surface can detect the defects of the laser diode array as early as possible, eliminate the early failure of the laser diode array, and improve the stability of the laser diode array in the spaceborne field

Method used

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  • Aging screening test system and method for laser diode array
  • Aging screening test system and method for laser diode array
  • Aging screening test system and method for laser diode array

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0047] Such as figure 1 As shown, an aging screening test system of a laser diode array includes a laser diode array drive module 1 for supplying power to the laser diode array, a temperature control module 2 for controlling the working temperature of the laser diode array, and a laser diode array for controlling Carry out simulated aging to obtain the aging module 3 of the laser diode array after aging, which is used to test the laser diode array and the screening test module 4 of the performance of the laser diode array after aging and the laser diode array driver module 1, the temperature control module 2, the aging module 3, The computer-controlled acquisition module 5 that is used to control the working conditions of the laser diode array and collects and records the test results of the screening test module 4 is electrically connected to the screening test module 4;

[0048] The screening test module 4 is used to perform electro-optical characteristic test, spectrum test...

Embodiment 2

[0050] Such as figure 2 As shown, an aging screening test system of a laser diode array includes a laser diode array drive module 1 for supplying power to the laser diode array, a temperature control module 2 for controlling the working temperature of the laser diode array, and a laser diode array for controlling Carry out simulated aging to obtain the aging module 3 of the laser diode array after aging, which is used to test the laser diode array and the screening test module 4 of the performance of the laser diode array after aging and the laser diode array driver module 1, the temperature control module 2, the aging module 3, The computer-controlled acquisition module 5 that is used to control the working conditions of the laser diode array and collects and records the test results of the screening test module 4 is electrically connected to the screening test module 4;

[0051] The laser diode array driver module 1 is powered by 220V AC;

[0052] The temperature control m...

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Abstract

The invention provides an aging screening test system and method for a laser diode array, and the system comprises a laser diode array drive module, a temperature control module, an aging module, a screening test module, and a computer control collection module which is used for controlling the working conditions of the laser diode array and collecting and recording the test result of the screening test module. The screening test module comprises an electro-optical characteristic test module, a spectrum test module, a far-field test module, a near-field test module and a microscopic examination module. The method comprises near-field luminous point test and microscopic examination test functions as well as test screening after aging of the laser diode array, full-parameter screening test of the laser diode array is realized, and through aging test, film microscopic examination of electro-optic characteristics, spectra, far-field luminous points, near-field luminous points and luminoussurfaces of the laser diode array before and after aging is carried out, the defects of the laser diode array can be found as soon as possible, the early failure problem of the laser diode array is eliminated, and the stability of the laser diode array in the satellite-borne field is improved.

Description

technical field [0001] The invention relates to the technical field of semiconductor lasers, in particular to an aging screening test system and method for a laser diode array. Background technique [0002] Due to its advantages of high power, small size and high conversion efficiency, laser diode array has gradually replaced the flash lamp pump source in solid-state lasers and has become a widely used pump source in all-solid-state lasers. The all-solid-state lasers used in the spaceborne field have high requirements for stability, so there are also strict requirements for the stability of the laser diode array, and aging screening of the selected laser diode array is required. [0003] The stability of the laser diode array directly affects the stability of the all-solid-state laser, especially the laser diode array used in the spaceborne field. The test system of the laser diode array in the prior art can realize the test of the electro-optic characteristic, the spectral...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R31/26G01M11/02G01N21/95
CPCG01R31/003G01R31/2601G01M11/02G01N21/95Y02E10/50
Inventor 李之通赵一鸣李静马勋鹏李祚涵
Owner BEIJING RES INST OF TELEMETRY
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