Nitride resonance tunneling diode structure suitable for ultraviolet light detection
A resonant tunneling and nitride technology, which is applied in the direction of electrical components, circuits, semiconductor devices, etc., can solve the problem of resonant tunneling from electrons to double barrier structures, no ultraviolet light detection combination technology, and raising the energy band of GaN intrinsic layer etc. to achieve the effects of low background dark current, enhanced ultraviolet light detection quantum efficiency, and low dark noise
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[0030] According to the above-mentioned material structure characteristics, a specific embodiment of the present invention is as follows image 3 shown.
[0031] Using GaN self-supporting substrate material, from the substrate material to the top includes:
[0032] (1) GaN self-supporting substrate material.
[0033] (2) n-type doped GaN electrode layer 1, thickness 100 nm, electron concentration = 5E18 cm -3 .
[0034] (3) Intrinsic GaN layer 2 with a thickness of 20 nm.
[0035] (4) AlGaN / GaN superlattice layer 3, the superlattice is Al0.5Ga0.5N=2 nm, GaN=1 nm periodic structure, and the number of superlattice periods=13 periods.
[0036] (5) Resonant tunneling double barrier structure layer 4, wherein the AlN barrier layer 4-1 has a thickness of 2 nm; the GaN quantum well layer 4-2 has a thickness of 3 nm; the AlN barrier layer 4-3 has a thickness of 2 nm.
[0037] (6) GaN doped layer 5, thickness 10 nm, p-type doped, hole concentration = 1E17 cm -3 .
[0038] (7) Ga...
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