Multi-view three-dimensional measurement system and method
A three-dimensional measurement, multi-view technology, applied in measurement devices, image data processing, instruments, etc., can solve the problems of cumbersome operation and low precision, and achieve the effect of ensuring measurement accuracy, reducing equipment costs, and realizing three-dimensional reconstruction.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0052] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the associated drawings. An embodiment of the invention is shown in the accompanying drawings. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present invention more thorough and comprehensive.
[0053] A specific implementation method of a multi-view three-dimensional measurement system provided by the present invention is as follows.
[0054] Please refer to figure 1 , In one of the specific embodiments, the entire system includes a projector 10 and a projector lens 15 , a beam splitter plate 20 , a color camera 30 and a color camera lens 35 , a surrounding camera 41 and a surrounding camera lens 45 .
[0055] The optical axis of the projector 10 is perpend...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com