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A multi-view three-dimensional measurement system and method

A three-dimensional measurement and multi-view technology, which is applied in the directions of measuring devices, image analysis, image enhancement, etc., can solve the problems of cumbersome operation and low precision, and achieve the effects of ensuring measurement accuracy, accurate 3D reconstruction, and reducing equipment costs

Active Publication Date: 2021-10-08
XI AN JIAOTONG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to solve the problems of low precision and cumbersome operation in the three-dimensional measurement of high dynamic reflectivity objects, and propose a multi-view three-dimensional measurement system and method for the detection of reflective objects with simple operation and high speed

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  • A multi-view three-dimensional measurement system and method
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  • A multi-view three-dimensional measurement system and method

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Embodiment Construction

[0052] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the associated drawings. An embodiment of the invention is shown in the accompanying drawings. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present invention more thorough and comprehensive.

[0053] A specific implementation method of a multi-view three-dimensional measurement system provided by the present invention is as follows.

[0054] Please refer to figure 1 , In one of the specific embodiments, the entire system includes a projector 10 and a projector lens 15 , a beam splitter plate 20 , a color camera 30 and a color camera lens 35 , a surrounding camera 41 and a surrounding camera lens 45 .

[0055] The optical axis of the projector 10 is perpend...

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Abstract

The invention discloses a multi-view three-dimensional measurement system and method. The system includes a projector, a surrounding camera, a beam splitter, and a color camera. The surrounding camera adopts a tilted image plane structure to meet the depth of field requirements. The beam splitter is used for imaging of the color camera, and the color camera is used to Restore object color information. The calibration measurement method is to establish an oblique image plane imaging model for the surrounding cameras, and use the camera to shoot the calibration plate and extract the coordinates of the feature points, and use the Zhang Zhengyou calibration method to obtain the internal and external parameters of the camera; use the principle of the pseudo-camera method to calibrate the internal and external parameters of the projector ;By the principle of binocular stereo calibration, the relationship between each camera coordinate system and the projector coordinate system is calibrated to realize system calibration; the multi-view point cloud fusion is realized by establishing the world coordinate system on the projector coordinate system. The system has the advantages of high measurement accuracy, fast speed, easy operation and can perform three-dimensional measurement on objects with high reflectivity.

Description

technical field [0001] The invention belongs to the field of structured light three-dimensional measurement, and in particular relates to a multi-view three-dimensional measurement system and method. Background technique [0002] With the advancement of modern precision measurement technology, optical measurement has developed rapidly. Structured light 3D measurement is widely used in product design, quality inspection, reverse engineering, biomedicine and many other fields due to its advantages of high precision, fast speed and non-contact. Among them, grating projection structured light 3D measurement has been widely studied because of its high measurement accuracy, high efficiency and simple implementation. [0003] At present, the three-dimensional measurement of objects in the range of high dynamic reflectivity is mostly achieved by spraying anti-reflective powder. The process is cumbersome and the accuracy is low, especially for small objects such as PCB boards, and i...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25G01B11/00G06T7/80G06T7/90
CPCG01B11/002G01B11/2504G01B11/254G06T2207/10028G06T7/80G06T7/85G06T7/90
Inventor 杨树明郑逢鹤胡鹏宇刘勇
Owner XI AN JIAOTONG UNIV
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