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Defect detection method and system for metal three-dimensional lattice structure

A three-dimensional lattice and defect detection technology, applied in image data processing, instrument, character and pattern recognition, etc., can solve the problems of defective metal three-dimensional lattice structure and inconspicuous features, and achieve better robustness and improved accuracy. degree of effect

Pending Publication Date: 2020-07-03
YANSHAN UNIV
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  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, the traditional algorithm can work well for regular defects and relatively simple scenes, but it is no longer suitable for metal 3D lattice structures with inconspicuous features and similar defects and backgrounds.

Method used

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  • Defect detection method and system for metal three-dimensional lattice structure
  • Defect detection method and system for metal three-dimensional lattice structure
  • Defect detection method and system for metal three-dimensional lattice structure

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Embodiment Construction

[0053] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0054] In order to make the above objects, features and advantages of the present invention more clearly understood, the present invention will be described in further detail below with reference to the accompanying drawings and specific embodiments.

[0055] figure 1 It is a schematic flowchart of the defect detection method of the metal three-dimensional lattice structure of the present invention. like figure 1 As shown, the defec...

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Abstract

The invention relates to a defect detection method and system for a metal three-dimensional lattice structure. The method comprises the following steps: acquiring a sectional image of a metal three-dimensional lattice structure; performing feature extraction on the tomographic image by adopting a feature extraction network in a darknet-53 network model to obtain multi-scale prediction informationcorresponding to the tomographic image; determining a defect category corresponding to each prediction frame according to the prediction information; according to the clustering center in the darknet-53 network model, correcting the position information of each prediction box by using a yolol layer to obtain the actual position of each prediction box; determining a final prediction box by adoptingan NMS algorithm according to the actual position of the prediction box; and determining the position and the defect type of the defect in the metal three-dimensional lattice structure according to the final prediction box. The method can be suitable for a metal three-dimensional lattice structure, and then the defect detection accuracy is improved.

Description

technical field [0001] The invention relates to the field of defect detection, in particular to a defect detection method and system of a metal three-dimensional lattice structure. Background technique [0002] Metal three-dimensional lattice materials not only have the characteristics of high porosity, but also have excellent properties such as light weight and high strength, explosion resistance and impact resistance, efficient heat dissipation and heat insulation, and absorption of electromagnetic waves and sound. This material is often used in aerospace and industrial equipment manufacturing through additive manufacturing. During additive manufacturing, the material is heated to a molten state and then cooled and formed layer by layer. However, the rapid solidification of the material from the molten state will generate a large amount of residual stress, which will cause structural warpage, cracks, faults and other defects. These defects affect the safety and reliabilit...

Claims

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Application Information

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IPC IPC(8): G06T7/00G06K9/62
CPCG06T7/0004G06T2207/20081G06T2207/30136G06F18/23213G06F18/2415
Inventor 张玉燕任腾飞温银堂张芝威
Owner YANSHAN UNIV
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