A residual gas charged particle beam monitoring device and method thereof

Abstract

The invention relates to a residual gas charged particle beam monitoring device and method thereof, which comprises an ultra-high vacuum chamber, a magnet is arranged outside the ultra-high vacuum chamber, the ultra-high vacuum chamber is connected to a support, and the support is connected to a lead flange; an electric field device and a high-precision two-dimensional position-sensitive detector are set on the bracket; the bottom of the detector is provided with a pixel chip binding plate, and the charge-collecting pixel detector is located at the center of the pixel chip binding plate, and the chip on the pixel chip binding plate The peripheral circuit is connected, and the chip peripheral circuit on the pixel chip binding board is connected to the external data acquisition system through the external interface; the anode electronic adjustment electrode, MCP, MCP power supply electrode and secondary electron are fixedly arranged on the top of the pixel chip binding board in sequence Inhibition electrode. The invention can measure the density distribution, direction, intensity and time structure of the charged particle beam in a non-intercepting manner in real time in an ultra-high vacuum environment, and can be widely used in various proton accelerators and heavy ion accelerators.

Description

technical field [0001] The invention relates to the field of beam current measurement of charged particle beams, in particular to a residual gas charged particle beam current monitoring device and method thereof. Background technique [0002] Particle accelerator is an important basic scientific research facility for human beings to understand the microstructure of matter. In accelerator experiments and applications, efficient and stable beam distribution is the primary factor for the success of experiments, and beam monitoring technology in beam adjustment is a key part of improving beam adjustment efficiency and beam quality. There are two main types of beam monitoring technologies, namely, intercepting beam detection and non-intercepting beam detection. [0003] Interception beam detection technology includes fluorescent screen detectors, Faraday cage array detectors, single-filament or multi-filament scanning detectors and MCP detectors. Among them, the fluorescent scr...

AI Technical Summary

Problems solved by technology

Depending on the performance of the optical system and CCD camera, the enhanced CCD camera detector can achieve a better position resolution of 100 μm or even tens of μm; but its image acquisition frequency is about 100Hz, and the time resolution is very poor, about 10ms

In order to solve the problem of poor time resolution of the enhanced CCD camera detector, it is generally necessary to configure other detector types for time measurement, resulting in complex structure, higher cost and more cumbersome operation of RGIPM

In addition, CCD cameras do not have the property of anti-radiation, so they cannot be used in scenes with strong radiation environment

A detection technology that is similar to CCD cameras and has radiation resistance is the Charge Injection Device (CID) camera, but it has no advantages over CCD cameras in many other properties, such as its low quantum efficiency, narrow corresponding range, Low signal-to-noise ratio, large dark current, etc.

In short, although the MCP detector based on CCD or CID camera technology can achieve high position resolution, it cannot have good time resolution at the same time.

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