Residual gas charged particle beam monitoring device and method thereof

Abstract

The invention relates to a residual gas charged particle beam monitoring device and a method thereof. The device comprises an ultrahigh vacuum cavity, a magnet is arranged outside the ultrahigh vacuumcavity, the ultrahigh vacuum cavity is connected with a support, and the support is connected with a lead flange. An electric field device and a high-precision two-dimensional position sensitive detector are arranged on the support; a pixel chip binding plate is arranged at the bottom of a detector, a charge collection type pixel detector is arranged in the center of the pixel chip binding plateand connected with a chip peripheral circuit on the pixel chip binding plate, and the chip peripheral circuit on the pixel chip binding plate is connected with an external data acquisition system through an external interface. An anode electron adjusting electrode, an MCP, an MCP power supply electrode and a secondary electron suppression electrode are sequentially and fixedly arranged on the upper portion of the pixel chip binding plate. According to the invention, the density distribution, direction, intensity and time structure of the charged particle beam can be measured in real time in anultra-high vacuum environment in a non-interception manner, and the device and the method can be widely applied to various proton accelerators and heavy ion accelerators.

Description

technical field [0001] The invention relates to the field of beam current measurement of charged particle beams, in particular to a residual gas charged particle beam current monitoring device and method thereof. Background technique [0002] Particle accelerator is an important basic scientific research facility for human beings to understand the microstructure of matter. In accelerator experiments and applications, efficient and stable beam distribution is the primary factor for the success of experiments, and beam monitoring technology in beam adjustment is a key part of improving beam adjustment efficiency and beam quality. There are two main types of beam monitoring technologies, namely, intercepting beam detection and non-intercepting beam detection. [0003] Interception beam detection technology includes fluorescent screen detectors, Faraday cage array detectors, single-filament or multi-filament scanning detectors and MCP detectors. Among them, the fluorescent scr...

AI Technical Summary

Problems solved by technology

Depending on the performance of the optical system and CCD camera, the enhanced CCD camera detector can achieve a better position resolution of 100 μm or even tens of μm; but its image acquisition frequency is about 100Hz, and the time resolution is very poor, about 10ms

In order to solve the problem of poor time resolution of the enhanced CCD camera detector, it is generally necessary to configure other detector types for time measurement, resulting in complex structure, higher cost and more cumbersome operation of RGIPM

In addition, CCD cameras do not have the property of anti-radiation, so they cannot be used in scenes with strong radiation environment

A detection technology that is similar to CCD cameras and has radiation resistance is the Charge Injection Device (CID) camera, but it has no advantages over CCD cameras in many other properties, such as its low quantum efficiency, narrow corresponding range, Low signal-to-noise ratio, large dark current, etc.

In short, although the MCP detector based on CCD or CID camera technology can achieve high position resolution, it cannot have good time resolution at the same time.

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