An Ultrafast High Energy Electron Probe System Based on Ultrafast Broad Spectrum Electron Beam

Abstract

The invention relates to an ultrafast high-energy electron probe system based on an ultrafast wide-spectrum electron beam. The system includes a laser-driven electronic input system, a femtosecond laser time-accurate synchronization system, a combined magnet module, a sample and a separation magnet. The system uses the ultra-short and ultra-intense laser generated by the femtosecond laser to couple with the target to generate an ultra-fast wide-spectrum electron beam of 100 MeV. The ultra-fast wide-spectrum electron beam passes through the combined magnet module to generate time chirp. The femtosecond laser time-accurate time synchronization system can obtain picosecond-level ultrafast electron beams with time information, which can be used for ultrafast electron probes. The invention adopts the ultra-fast wide-spectrum high-energy electron beam driven by femtosecond laser as the electron source, can obtain the ultra-fast high-energy electron probe of picosecond, realizes the electron beam time resolution of picosecond level, and improves the electronic probe system The time resolution has achieved a hundred megaelectron volt high-energy electron probe, which has broad application prospects in ultrafast electron detection.

Description

technical field [0001] The invention relates to the field of ultrafast electron probes, in particular to an ultrafast high-energy electron probe system based on ultrafast wide-spectrum electron beams. Background technique [0002] As a widely used non-destructive detection method, the electronic probe has the characteristics of fast, high resolution, and high precision. However, the use of electronic probes to diagnose ultrafast processes requires ultrafast electron beams with time information. At the same time, For the detection of certain processes, ultrafast electrons with high energy (typically 10-100 MeV) are also required as electron probes. It is difficult to obtain picosecond-level and ultra-fast high-energy electron probes at the same time with the existing electronic probe systems. Contents of the invention [0003] The purpose of the present invention is to provide an ultrafast high-energy electron probe system based on ultrafast broad-spectrum electron beams, ...

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to provide an ultrafast high-energy electron probe system based on an ultrafast broad-spectrum electron beam, to solve the problem that the existing electron probe system is difficult to simultaneously obtain picosecond-level and ultrafast high-energy electron probes

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