Detachable modular VPX signal test fixture

Abstract

The invention discloses a detachable modular VPX signal test fixture. The detachable modular VPX signal test fixture comprises a front insertion module and a rear export module, the rear export moduleand daughter boards are the same in appearance, and the rear export module is provided with a backboard connector; and single-ended, differential, microwave or power supply VPX connectors with different functions are arranged in the front insertion module, and the sliding rail of the front insertion module is inserted into a slot of the rear export module, so that the VPX connector is electrically connected with the backboard connector. The rear export module is inserted into a VPX case, the backboard connector of the rear export module is electrically connected with the backboard of the VPXcase, signals are led out to a test instrument through the VPX connector, and then signal characteristics of connection between the backboard and the daughter boards or between the daughter boards inthe case can be detected. The VPX connectors with different functions such as single-ended, differential, microwave or power supply are arranged in the front insertion module, so that multiple functions of the VPX case can be tested.

Description

technical field [0001] The invention relates to the technical field of computers, an external device used for digital signal testing and debugging of a VPX case, in particular a detachable modular VPX signal testing fixture. Background technique [0002] VPX chassis has high-speed data acquisition, real-time signal processing and large-capacity storage functions, and has the characteristics of solid size, anti-interference, and vibration resistance. The usage of VPX chassis in the field of information and communication is increasing. Since the VPX chassis is internally connected by each sub-board to the backplane to complete the transmission and processing of various signals, in order to judge the characteristics of the connection signals between the backplane and the sub-board, it is necessary to configure a test fixture. The test fixtures for testing VPX signals in the prior art are all single customized printed boards. The problem is that the user needs to remove the back...

AI Technical Summary

Problems solved by technology

The test fixtures for testing VPX signals in the prior art are all single customized printed boards. The problem is that the user needs to remove the backplane or sub-board module from the VPX chassis for testing, resulting in troublesome disassembly and assembly. The performance of the fixture is simplistic, the test range is limited, and it cannot contain all test points. It is necessary to customize test fixtures for different signal points according to different users, resulting in low test efficiency and high cost.

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