Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

CT image beam hardening artifact correction system based on adjustable double factors

A technology of CT image and beam hardening, applied in the field of X-ray CT imaging, can solve problems such as difficulty in obtaining correction effects, and achieve the effect of eliminating artifacts

Active Publication Date: 2019-11-15
SHANDONG UNIV OF SCI & TECH
View PDF7 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0011] The above-mentioned patented technologies all involve correction methods for beam hardening artifacts in X-ray CT images, but most of them require prior knowledge or hardware devices, and it is difficult to obtain good correction results for detection objects composed of various materials or unknown materials

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • CT image beam hardening artifact correction system based on adjustable double factors
  • CT image beam hardening artifact correction system based on adjustable double factors
  • CT image beam hardening artifact correction system based on adjustable double factors

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0040] The specific embodiment of the present invention will be further described below in conjunction with accompanying drawing and specific embodiment:

[0041] A system for correcting beam hardening artifacts in CT images based on adjustable two-factors, including an edge information acquisition module, a projection data acquisition module, an artifact data approximate calculation module, and a corrected image acquisition module. During the correction process, it specifically includes the following steps :

[0042] Obtain the edge information of the high-density area in the CT image through the edge information acquisition module, use the threshold method on the original image with hardening artifacts to segment the high-density area, then use the active contour segmentation method to accurately obtain the edge information, and finally extract the high-density area Contour τ(D) of τ(D); In the edge information acquisition of high-density areas in CT images, the original ima...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a CT image beam hardening artifact correction system based on adjustable double factors, and particularly relates to the technical field of X-ray CT imaging. According to the system, in the correction process, a high-density region in a CT image is segmented to obtain edge information; projection data of the high-density area is calculated; the attenuation coefficient of the substance to the ray is approximately calculated to obtain artifact data caused by a high-density region; and finally, artifact data is reconstructed by using a classical filtering back projection algorithm, and the reconstructed artifact image is substracted from the original image to obtain a corrected CT image. The system can provide high-quality images for industrial CT and medical CT detection, and compared with a previous CT image beam hardening artifact correction method, the system can quickly and effectively eliminate hardening artifacts without priori knowledge.

Description

technical field [0001] The invention relates to the technical field of X-ray CT imaging, in particular to an adjustable dual-factor CT image beam hardening artifact correction system. Background technique [0002] X-ray CT (Computed Tomography, referred to as CT) is an advanced non-destructive testing technology, which has been widely used in many fields such as industry, medicine, and material testing. According to the different degrees of X-ray absorption of different substances, it reconstructs the tomographic image along the path of the rays. However, since the rays emitted by the X-ray tube are polychromatic, when they pass through the object to be measured, they interact with it, and the low-energy X-photons are preferentially absorbed, resulting in a significant proportion of the high-energy part of the X-ray in the material being passed through. increases, the average energy of the rays increases. This phenomenon can be interpreted as a "hardening" of the energy sp...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06T5/00G06T7/13G06T7/136G06T7/149
CPCG06T7/13G06T7/149G06T7/136G06T2207/10081G06T5/80Y02P90/30
Inventor 陈明张秀琰李刚韩景奇郑永果李涌
Owner SHANDONG UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products