Analog circuit fault diagnosis method based on polynomial fitting and state monitoring

Abstract

The invention discloses an analog circuit fault diagnosis method based on polynomial fitting and state monitoring. The method comprises steps: a transfer function of a monitoring point is acquired, fuzzy group information of the analog circuit is analyzed, a representative fault component of each fuzzy group is determined, a characteristic matrix of each representative fault component is obtainedbased on the transfer function, over determined systems by polynomial fitting are constructed, a coefficient vector corresponding to each representative fault component is calculated and obtained, andwhen the analog circuit fails, the monitoring point is subjected to state monitoring, a test matrix and a constant term matrix are acquired, a characteristic vector which enables a least squares distance to exist between the test matrix and the equation determined by the characteristic vector of each representative fault component is solved, and the corresponding representative fault component isthe fault diagnosis result. Thus, fault diagnosis on the analog circuit can be effectively realized.

Description

technical field [0001] The invention belongs to the technical field of analog circuit fault diagnosis, and more specifically relates to an analog circuit fault diagnosis method based on polynomial fitting and state monitoring. Background technique [0002] With the rapid development of integrated circuits, in order to improve product performance, reduce chip area and cost, it is necessary to integrate digital and analog components on the same chip. According to data reports, although the analog part only accounts for 5% of the chip area, its fault diagnosis cost accounts for 95% of the total diagnostic cost. Analog circuit fault diagnosis has always been a "bottleneck" problem in the integrated circuit industry. At this stage, some relatively well-developed analog circuit fault diagnosis theories have been applied to practice, such as: fault dictionary method in pre-test analog diagnosis method, component parameter identification method and fault verification method in post-...

AI Technical Summary

Problems solved by technology

Overlapping regions illustrate faults from different fault sources that could otherwise be distinguished, but due to tolerance effects, these faults have the same characteristics and are therefore inseparable

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