Method for testing internal stray radiation of thermal infrared spectrometer

Abstract

The invention discloses a method for testing internal stray radiation of a thermal infrared spectrometer. A radiation test is respectively performed on a full response band of a detector and a spectral channel of the thermal infrared spectrometer at an integration time by using a black body, an equivalent gray value and radiant flux of the internal stray radiation in the current state of the system can be measured by respectively performing a test on the detector and the spectrometer via the method, and the gray value and the radiant flux of the the internal stray radiation of the thermal infrared spectrometer at any integration time and any optical machine temperature can be obtained in combination with the optical machine temperature during the test. The method disclosed by the inventionis simple, can be used for effectively solving the problem that the internal stray radiation of the thermal infrared spectrometer seriously affects the system radiation precision and the system quantification, and is suitable for practical engineering applications.

Description

technical field [0001] The invention relates to the field of quantitative testing of remote sensing instruments, in particular to a testing method for stray radiation of a thermal infrared spectrometer. Background technique [0002] During the spectral splitting process of thermal infrared spectrometer, the signal light is divided into dozens to hundreds of bands. Due to the strong internal stray radiation generated by the radiation of the optical machine itself, the signal intensity is weaker than that of traditional imaging instruments, resulting in system signal noise. Ratio, the effective dynamic range is small, and the exposure time is difficult to increase; and the internal stray radiation increases with the increase of temperature, which seriously affects the system radiation accuracy and system quantification. Therefore, the measurement and calibration of the internal stray radiation of the thermal infrared spectrometer is particularly important for the research of t...

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to propose a test method for the internal stray radiation of the thermal infrared spectrometer system in order to solve the problem that the internal stray radiation calibration of the thermal infrared spectrometer seriously affects the system radiation accuracy and system quantification in practical engineering applications

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