Plasma emission spectrum interference correction method

Abstract

The invention, which belongs to the technical field of spectrum detection, particularly relates to a plasma emission spectrum interference correction method. Calculation is performed based on other characteristic spectrum line information of a corresponding element of an interference line B in a corrected spectral segment 20 to obtain a spectrum line intensity of the interference line B; and thusa to-be-analyzed spectrum peak 11 is decomposed conveniently to obtain a spectrum line intensity of an analysis line A, thereby completing e correction of the spectral interference. The method has thefollowing technical effects: the spectrum line can be decomposed accurately based on the intensity relationship of the same type of emission spectrum lines in a same ion state in the plasma emissionspectrum theory and the detection and calculation of the emission intensity of the spectrum line being easy to affect are realized, so that the accuracy of the component detection result is improved and the detection element range is extended. Therefore, the application range of LIBS technology is further expanded.

Description

technical field [0001] The invention belongs to the technical field of spectrum detection, in particular to a plasma emission spectrum interference correction method. Background technique [0002] Laser-Induced Breakdown Spectroscopy (LIBS) technology has the distinctive characteristics of fast detection speed, complete element types, and no need for sample preparation. It is considered to be the most promising online component detection technology. This technology focuses a high-energy pulsed laser on the surface of the detection sample to ablate the sample to generate plasma, and then analyzes the plasma emission spectrum to determine the material composition and content of the sample. [0003] In principle, LIBS technology can analyze samples in any physical state. However, in practical applications, the emitted light waves with wavelengths in the vacuum ultraviolet band are easily absorbed and scattered by the atmosphere or dust and smoke, and cannot be applied to the de...

AI Technical Summary

Problems solved by technology

[0003] In principle, LIBS technology can analyze samples in any physical state. However, in practical applications, the emitted light waves with wavelengths in the vacuum ultraviolet band are easily absorbed and scattered by the atmosphere or dust and smoke, and cannot be applied to the detection of most production sites. Therefore, the detection The wavelength range is limited not only by the detection instrument, but also by the application environment

In addition, limited by the detection accuracy and sensitivity of the detection instrument, when the characteristic spectral lines of the plasma emission light produced by the ablation of different elements are similar, the detection results will interfere with each other, which makes LIBS technology unable to be widely used in production applications.

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