Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A method for measuring the coverage of ligands on the surface of quantum dots

A technology of surface ligands and measurement methods, applied in the field of quantum dots, can solve problems such as poor uniformity of quantum dot solutions, uneven photoelectric efficiency, and affecting the film of the light-emitting layer, so as to avoid the coffee ring effect, ensure solubility, and improve pixel resolution. rate effect

Active Publication Date: 2021-12-14
TCL CORPORATION
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If the surface coverage of the quantum dots is low, the solubility of the quantum dots is poor, the uniformity of the quantum dot solution is poor, and the drying rate of the quantum dot solution and the coffee ring effect affect the quality of the light-emitting layer film, which directly leads to the quality of the printed panel. Problems such as unevenness, low pixel resolution, turn-on voltage, uneven photoelectric efficiency, etc.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0037] Determination of Coverage of Thiol Ligands on the Surface of CdSe Quantum Dots by TEM Combined with Thermogravimetric Analysis

[0038] Use TEM to determine the size d of the quantum dots, take the CdSe quantum dots whose surface ligand is octylthiol and dissolve them in n-hexane solution to prepare a 5 mg / ml solution. After the solution is completely dissolved, take a small amount of quantum dot solution and drop 5 Drop on the copper grid, and put the copper grid in the transmission electron microscope analyzer for testing and analysis. Set the accelerating voltage to 200kV, the emission current to 10μA, the working distance to 15 mm, and the dead time to 20%. For magnification analysis of the sample, first set the magnification to 70,000 times, take the area where the quantum dots are concentrated and uniformly dispersed for focusing analysis, and take its TEM picture. To analyze the TEM image, first set the scale length, and then take 30-80 quantum dots for calibrat...

Embodiment 2

[0042] Determination of long-chain alkyl acid ligand coverage on the surface of CdSe quantum dots by TEM combined with thermogravimetric analysis

[0043] The size d of the quantum dots was determined using TEM. Take the CdSe quantum dot whose surface ligand is octadecenoic acid and dissolve it in n-hexane solution to prepare a 1 mg / ml solution. After the solution is completely dissolved, take a small amount of quantum dot solution and drop 10 drops on the copper grid. Placed in a transmission electron microscope analyzer for test analysis. Set the acceleration voltage to 300kV, the emission current to 10μA, the working distance to 15 mm, and the dead time to 20%. For magnification analysis of the sample, first set the magnification to 150,000 times, take the area where the quantum dots are concentrated and evenly dispersed for focusing analysis, and take its TEM picture. To analyze the TEM image, first set the scale length, and then take 30-80 quantum dots for calibration, ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
sizeaaaaaaaaaa
densityaaaaaaaaaa
densityaaaaaaaaaa
Login to View More

Abstract

The invention provides a method for measuring the ligand coverage on the surface of quantum dots, which can be used for quality assessment of quantum dots. If K i less than 2*10 ‑10 mol / cm 2 , the quality of quantum dots is not good, and K i Increase the value before proceeding with applications such as solution or ink dispensing. Adopt this method to determine quantum dot surface ligand coverage rate, result is accurate, easy to operate, further, can guarantee the stability of quantum dot surface ligand content by the method of the present invention, can guarantee the solubility of different batches of quantum dots, avoid The coffee ring effect caused by the different drying rates when the quantum dot solution is prepared into a film can improve the uniformity of the pixel resolution, turn-on voltage, and photoelectric efficiency of the quantum dot display panel.

Description

technical field [0001] The invention relates to the technical field of quantum dots, in particular to a method for measuring ligand coverage on the surface of quantum dots. Background technique [0002] Quantum dots refer to semiconductor nanocrystals whose geometric size is smaller than their excitonic Bohr radius. Quantum dots have great potential applications in the fields of biomedicine, environmental energy, and lighting display due to their excellent optical properties such as absorption bandwidth, narrow fluorescence emission band, high quantum efficiency, and good photostability. The display technology based on quantum dot luminescence has been highly valued by the display industry in recent years. Compared with liquid crystal display and organic light-emitting display, quantum dot luminescence has a wider color gamut, higher color purity, simpler structure, and higher stability. It is considered It is a new generation display technology. [0003] The preparation t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N5/00G01N15/02
Inventor 覃辉军叶炜浩杨一行
Owner TCL CORPORATION
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products