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Solid defect color center polarizability detection system and method

A detection system and detection method technology, applied in the direction of material excitation analysis, fluorescence/phosphorescence, etc., can solve the problem of not being able to obtain the polarizability, achieve the effect of shortening the relaxation time and improving the signal-to-noise ratio

Active Publication Date: 2019-06-21
BEIHANG UNIV
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Problems solved by technology

However, what is the specific polarizability, the specific value of the polarizability cannot be obtained by these methods

Method used

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  • Solid defect color center polarizability detection system and method
  • Solid defect color center polarizability detection system and method
  • Solid defect color center polarizability detection system and method

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Embodiment Construction

[0025] In order to express the technical solutions and advantages of the embodiments of the present invention more clearly, the technical solutions of the present invention will be further described in detail below with reference to the drawings and embodiments.

[0026] figure 1 A flow chart of a method for detecting polarizability based on a diamond NV color center provided by an embodiment of the present invention, image 3 A diagram of a susceptibility detection system based on a diamond NV color center provided by an embodiment of the present invention, Figure 4 A kind of susceptibility detection result figure based on diamond NV color center provided for an embodiment of the present invention, such as figure 1 , image 3 , Figure 4 As shown, the method may include:

[0027] Step 100, manipulating the sample to realize electron spin polarization of the NV color center;

[0028] Step 110, applying a detection laser to the sample, changing the intensity of the detect...

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Abstract

The invention discloses a solid defect color center polarizability detection system and method. According to one embodiment of the present invention, a diamond material containing a high-concentrationNV (nitrogen-vacancy) center is adopted as a sensitive component; a sample is operated, the polarization of electron spin is realized; and the measurement of polarizability is realized through optical polarization pulses and an optimal pulse spin projection detection method. Compared with methods, such as methods for detecting spin-related fluorescence intensity, single-state infrared absorptionand current, the method provided by the invention can accurately measure the electron polarization and optical pumping rate of a solid defect color center, greatly improve a signal-to-noise ratio andgreatly shorten relaxation time, has a high application value for analyzing the performance of a quantum principle-based magnetic field measurement system, and will serve engineering practice such assensing measurement and control feedback.

Description

technical field [0001] The invention relates to the technical fields of quantum computing and quantum precision measurement, in particular to a detection system and method for the polarizability of a solid defect color center. Background technique [0002] As a solid-state spin system, NV color centers are considered as a promising quantum sensor with great application potential in quantum sensing and quantum computing. For relevant quantum applications, the manipulation and detection of quantum spins is required. At present, the main spin detection method is to detect the spin-related fluorescence intensity, and there are also singlet infrared absorption detection and current detection methods. The methods described above focus on the relative change in the value of the susceptibility after operation, which indicates that the susceptibility is somewhere between a maximum and a minimum, or an amount of change. However, what is the specific polarizability, the specific valu...

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Application Information

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IPC IPC(8): G01N21/64
Inventor 袁珩刘禹辰张冀星陈禄韩志强姜尚韬
Owner BEIHANG UNIV
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