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Double-darkroom structure for MIMO OTA test and test method

A darkroom and test area technology, applied in the field of multi-input and multi-output equipment performance testing, can solve the problems of increased difficulty and complicated operation of 5GMassive MIMO antenna system testing

Active Publication Date: 2019-06-14
BEIJING UNIV OF POSTS & TELECOMM
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Problems solved by technology

[0006] The purpose of the embodiments of the present invention is to provide a dual-chamber structure and test method for MIMO OTA testing, to solve the problem of complex operation of the 5G Massive MIMO antenna system in the prior art, and to increase the test capacity of the 5G Massive MIMO antenna system in the later stage. Difficult technical issues

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  • Double-darkroom structure for MIMO OTA test and test method

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Embodiment Construction

[0072] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0073] First of all, in order to facilitate the understanding of the embodiments of the present invention, here is an introduction to the terms "first dark room", "second dark room", "first group of probes" and "second group of probes" used in the context of the embodiments of the present invention. The first device under test", "the second device under test", "the first radio frequency lead", "the second radio frequency lead", "the first signal" and "the secon...

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Abstract

The embodiment of the invention provides a double-darkroom structure for an MIMO OTA test and a test method. The double-darkroom structure comprises a first darkroom, a second darkroom, a third darkroom and a fourth darkroom, wherein the first darkroom comprises a first tested device and a first group of probes which are respectively arranged in the first darkroom according to a real environment simulated by a first tested device, are arranged in a non-contact manner and transmit a first signal in a radiation manner. The second darkroom comprises a second tested device and a second group of probes which are respectively arranged in the second darkroom according to a real environment simulated by the second tested device, are arranged in a non-contact manner and transmit a second signal ina radiation manner. The channel simulator comprises a channel port on one side and is connected with the first group of probes through a first radio frequency wire penetrating through the first darkroom, and the channel port on the other side and contained in the channel simulator is connected with the second group of probes through a second radio frequency wire penetrating through the second darkroom.

Description

technical field [0001] The present invention relates to the technical field of Multiple-Input Multiple-Output (MIMO for short) equipment performance testing, in particular to a double darkroom structure and testing method for MIMO OTA testing. Background technique [0002] At present, in order to ensure the quality of the products produced, manufacturers need to conduct comprehensive tests on the products during the product development stage. The product here can be explained using a smartphone as an example. Smart terminals use the LTE protocol for communication, and the LTE protocol uses MIMO technology, which is an important technology for the new generation of communication. The general MIMO test method may use an over-the-air test (Over-The-Air Test, OTA for short). Among them, the MIMO OTA test method mainly includes: a multi-probe anechoic chamber (Multi-Probe Anechoic Chamber, MPAC for short) method. [0003] In order to greatly improve spectrum efficiency and net...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04B7/0413H04B17/00
Inventor 李勇孙浩
Owner BEIJING UNIV OF POSTS & TELECOMM
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