Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A Performance Testing Method of Josephson Parametric Amplifier

A parametric amplifier and testing method technology, applied in the field of performance testing of Josephson parametric amplifiers, can solve the problems of reducing the performance testing efficiency of Josephson parametric amplifiers, increasing the workload of data analysis, increasing the difficulty of data processing, etc., so as to reduce the workload of scanning , Reduce the difficulty of data processing, reduce the effect of blindness

Active Publication Date: 2019-08-02
ORIGIN QUANTUM COMPUTING TECH (HEFEI) CO LTD
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] 1. The existing technology repeatedly scans the pump power and bias current in a large range at a fixed pump frequency to observe the gain of each operating point, then replaces the pump frequency and repeats the above steps. The blindness is too high, and this Slightly repetitive blind scanning obtains a large amount of data, increases the workload of data analysis, increases the difficulty of data processing, and greatly reduces the performance test efficiency of Josephson parametric amplifiers
[0006] 2. In the existing technology, the bias current, pump frequency and pump power are repeatedly scanned in a large range, and the scanning time is long and extremely time-consuming

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Performance Testing Method of Josephson Parametric Amplifier
  • A Performance Testing Method of Josephson Parametric Amplifier
  • A Performance Testing Method of Josephson Parametric Amplifier

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0046] The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention.

[0047] Embodiments of the present invention provide a method for testing the performance of Josephson parametric amplifiers, such as figure 1 The performance test system implementation of the Josephson parametric amplifier shown, figure 1 The performance testing system of the Josephson parametric amplifier shown includes a microwave source signal system 1 , a bias flux current signal system 2 , a network analyzer system 3 , a spectrum analyzer system 4 and a Josephson amplifier 5 .

[0048] Wherein: the microwave source signal system 1 comprises the microwave source that is used to provide the pump signal, and a plurality of band-pass filters BPF and a plurality of signal attenuators that carry out preliminary processing to the pump signal, a plurality of band-pass filters BPF and a plurality...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the field of amplifier test, and discloses a performance test method for a Josephson parametric amplifier. The performance test method comprises the following steps: measuringa first gain curve of the Josephson parametric amplifier according to a first reference parameter, and determining a second reference parameter corresponding to a gain interval satisfying a preset gain threshold range on the first gain curve; measuring a second gain curve of the Josephson parametric amplifier according to a second reference parameter; determining a third reference parameter according to a maximum gain bandwidth value on the second gain curve; measuring a third gain curve of the Josephson parametric amplifier according to the third reference parameter; and determining an optimal operating point parameter according to the maximum gain bandwidth value on the third gain curve. According to the performance test method for the Josephson parametric amplifier provided by the invention, each measurement is based on a previous measurement result, thus the blindness and the data acquisition quantity of the test work are reduced, and the performance test work of the Josephson parametric amplifier is effectively improved.

Description

technical field [0001] The invention belongs to the field of amplifier testing, in particular to a performance testing method of a Josephson parametric amplifier. Background technique [0002] In superconducting quantum computing, the superconducting quantum chip is in an extremely low temperature (<30mK) environment, which is greatly affected by noise, and the output signal from the superconducting quantum chip is very weak. Generally, it is necessary to add a multi-stage amplifier after the output end Used to increase signal strength. At present, commercial cryogenic amplifiers generally work in the 4K temperature layer, which will bring great thermal noise, while the Josephson parametric amplifier that works in the same temperature layer as the superconducting quantum chip has a great gain and does not introduce additional noise. characteristics, so the Josephson parametric amplifier is a necessary device for superconducting quantum computing. [0003] The performanc...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 杨夏朱美珍
Owner ORIGIN QUANTUM COMPUTING TECH (HEFEI) CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products