Nonmetallic material defect detecting device and method

Abstract

The invention provides a nonmetallic material defect detecting device and method. The device comprises an excitation source and an infrared thermal imager. The excitation source and a lens of the infrared thermal imager form a preset included angle. The excitation source is used for providing infrared light illuminating the surface of a nonmetallic sample. The infrared thermal imager is used for obtaining an infrared thermal image on the surface of the nonmetallic sample. Through the device, nonmetallic material defect detection is conducted, and the unevenness of radiation of the excitation source on the tested sample is reduced; meanwhile, the reflection problem of the excitation source on the surface of the tested sample is solved, the nonmetallic material defect detection accuracy andsensitivity are improved, and the false drop rate and omission rate are reduced.

Description

technical field [0001] The invention relates to the technical field of non-destructive testing, in particular to a non-metallic material defect detection device and detection method. Background technique [0002] With the rapid development of science and technology, non-destructive testing is an important means for modern industry to ensure product quality and safety performance and stabilize production processes. Commonly used non-destructive testing methods are eddy current testing, radiographic testing, ultrasonic testing, magnetic particle testing and liquid penetrant testing. [0003] In the prior art, the mid-infrared thermal wave detection technology has been rapidly developed due to its advantages of fast real-time, non-destructive, non-contact, no coupling, large area, and long-distance detection. It has wider applicability, can be used for metal and non-metal detection, can realize non-contact detection and online and in-service monitoring of operating equipment, ...

AI Technical Summary

Problems solved by technology

[0005] The invention provides a non-metallic material defect detection device and detection method to improve the uniformity of the excitation source to the test sample radiation; at the same time, it solves the reflection problem of the excitation source on the surface of the test sample, and improves the non-metal material defect detection. High accuracy and sensitivity, reducing false detection rate and missed detection rate

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