Photoelectric product environmental stress screening method

A technology for environmental stress screening and optoelectronic products, applied in electrical digital data processing, special data processing applications, instruments, etc., to achieve the effect of simple realization and early failure elimination

Active Publication Date: 2019-03-19
BEIJING INST OF REMOTE SENSING EQUIP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The object of the present invention is to provide an environmental stress screening method for optoelectronic products, which solves the problem of effectively eliminating early defects of optoelectronic products without damaging the product or consuming too much product life and ensuring its reliability.

Method used

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  • Photoelectric product environmental stress screening method

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Experimental program
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Effect test

Embodiment 1

[0018] Please refer to figure 1 , the concrete steps of the environmental stress screening method of a kind of optoelectronic product of the present invention are:

[0019] The first step is to build an analysis system for environmental stress screening methods

[0020] The hardware composition of the analysis system of the environmental stress screening method includes: a computer, a modal analyzer, and an electromagnetic vibration table. The software composition includes: Pro\E, HyperMesh, Ansys software.

[0021] The second step is the establishment of the finite element model of optoelectronic products

[0022] Import the Pro\E structure model of optoelectronic products into HyperMesh software to establish a finite element model, including model modification and simplification, grid division, material property definition and constraint conditions imposition, etc.

[0023] The third step is the verification of the finite element model of optoelectronic products

[0024]...

Embodiment 2

[0033] The concrete steps of the environmental stress screening method of a kind of optoelectronic product of the present invention are:

[0034] The first step is to build an analysis system for environmental stress screening methods

[0035] The hardware composition of the analysis system of the environmental stress screening method includes: a computer, a modal analyzer, and an electromagnetic vibration table. The software composition includes: Pro\E, HyperMesh, Ansys software.

[0036] The second step is the establishment of the finite element model of optoelectronic products

[0037] Import the Pro\E structure model of optoelectronic products into HyperMesh software to establish a finite element model, including model modification and simplification, grid division, material property definition and constraint conditions imposition, etc.

[0038] The third step is the verification of the finite element model of optoelectronic products

[0039] Modal analysis and verifica...

Embodiment 3

[0048] The concrete steps of the environmental stress screening method of a kind of optoelectronic product of the present invention are:

[0049] The first step is to build an analysis system for environmental stress screening methods

[0050] The hardware composition of the analysis system of the environmental stress screening method includes: a computer, a modal analyzer, and an electromagnetic vibration table. The software composition includes: Pro\E, HyperMesh, Ansys software.

[0051] The second step is the establishment of the finite element model of optoelectronic products

[0052] Import the Pro\E structure model of optoelectronic products into HyperMesh software to establish a finite element model, including model modification and simplification, grid division, material property definition and constraint conditions imposition, etc.

[0053] The third step is the verification of the finite element model of optoelectronic products

[0054] The main frame structure of...

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PUM

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Abstract

The invention discloses a photoelectric product environmental stress screening method, and the method comprises the steps: carrying out the modal analysis and verification test of a photoelectric product, so as to ensure the correctness of a finite element model; the correctness of the random vibration analysis method is ensured by carrying out random vibration analysis and verification tests on the photoelectric product; Modal and random vibration analysis is carried out on main or key components in the photoelectric product, and the random vibration spectrum shape and magnitude stipulated byGJB1032 are cut according to the analysis result, so that the environmental stress screening method of the photoelectric product is completed. According to the method, the finite element model of thephotoelectric product can be accurately established in a short time, and the inherent frequency is confirmed. And through random vibration analysis, weak links of the product are clear, and the method is an environmental stress screening method with a very good popularization prospect.

Description

technical field [0001] The invention relates to a screening method for environmental stress of optoelectronic products, in particular to a screening method for environmental stress of products. Background technique [0002] In order to effectively eliminate the early defects of optoelectronic equipment without damaging the product or consuming too much product life and ensuring its reliability, an environmental stress screening method suitable for optoelectronic products is proposed. For the screening of optoelectronic products, the domestic standards GJB4508-2002 "General Requirements for Environmental Stress Screening of Optoelectronic Devices" and GJB5018-2001 "General Requirements for Screening and Acceptance of Semiconductor Optoelectronic Devices" are only for optoelectronic devices. At the component level and equipment level, there are currently no national military standards or industry standards that can be relied upon. The standards that can be relied on abroad ar...

Claims

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Application Information

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IPC IPC(8): G06F17/50
CPCG06F30/23G06F2119/06
Inventor 张海洲童雨吕瑛
Owner BEIJING INST OF REMOTE SENSING EQUIP
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