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Device and method suitable for measuring dielectric parameter of high reflection material in terahertz frequency band

A technology for dielectric parameters and measurement methods, applied in the terahertz field, can solve the problems of inaccurate reflectivity amplitude, phase measurement, and inability to accurately invert material dielectric parameters, and achieve the effect of improving measurement accuracy

Active Publication Date: 2019-01-11
BEIJING INST OF ENVIRONMENTAL FEATURES
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] The technical problem to be solved by the present invention is to solve the problem of inaccurate reflectivity amplitude and phase measurement in the measurement of high-reflection materials in the terahertz frequency band in the prior art, and the inability to accurately invert the dielectric parameters of the material

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  • Device and method suitable for measuring dielectric parameter of high reflection material in terahertz frequency band
  • Device and method suitable for measuring dielectric parameter of high reflection material in terahertz frequency band
  • Device and method suitable for measuring dielectric parameter of high reflection material in terahertz frequency band

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Embodiment 1

[0057] An embodiment of the present invention provides a device suitable for measuring dielectric parameters of highly reflective materials in the terahertz frequency band, including: a reference plate, a transmission measurement module, a reflection measurement module, and a calculation module. Among them, the transmission measurement module is used to measure the terahertz wave transmission of the reference plate; the reflection measurement module is used to respectively obtain the terahertz wave energy reflected by the reference plate and the material plate to be tested under the same set incident angle; The measurement results of the transmission measurement module obtain the refractive index and extinction coefficient of the reference plate and calculate the reflectance reflected by the reference plate at a set incident angle, and combine the terahertz wave energy reflected by the reference plate and the material plate to be tested to calculate the The reflectivity and pha...

Embodiment 2

[0074] Such as figure 2 As shown, the second embodiment provides a method for measuring the dielectric parameters of highly reflective materials in the terahertz frequency band, which can be carried out by using the dielectric parameter measurement device for high-reflection materials in the terahertz frequency band described in any of the above-mentioned embodiments. measurement, including the following steps:

[0075] S1. Perform terahertz wave transmission measurement on the reference plate, obtain the refractive index and extinction coefficient of the reference plate, and calculate the reflectance reflected by the reference plate at a set incident angle;

[0076] S2, respectively measuring the terahertz wave energy reflected by the reference plate and the material plate to be tested under the same set incident angle;

[0077] S3. Calculate the reflectivity of the material plate to be measured in the measurement frequency band according to the reflectance of the reference...

Embodiment 3

[0118] The third embodiment is basically the same as the second embodiment, and the similarities will not be repeated. The difference lies in:

[0119] In this embodiment, the reflectivity of metal aluminum is measured with a silicon chip reference plate, such as image 3 As shown, the measurement frequency range (frequency band II) is 0.2-3THz, and the phase shift integration is divided into three segments: frequency band I: 0-0.2THz, frequency band II: 0.2-3THz, frequency band II: above 3THz, and according to the K-K relationship The dielectric parameters are calculated as Figures 4a to 4d as shown, Figure 4a is the refractive index curve of metal aluminum; Figure 4b is the metal aluminum extinction coefficient curve; Figure 4c is the real part curve of the dielectric parameter of metal aluminum; Figure 4d is the imaginary part curve of the dielectric parameter of metal aluminum.

[0120] According to the article Optical properties of Al, Fe, Ti, Ta, W, and Mo at s...

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Abstract

The invention relates to a device and a method suitable for measuring dielectric parameters of a high reflection material in a terahertz frequency band. The device comprises a reference plate, a transmission measuring module, a reflection measuring module, and a calculating module. The method comprises: taking a partially transmissive, partially reflective material as a reference plate; performinga transmission measurement on the reference plate to obtain a complex refractive index of the reference plate, and estimating the reflectance of the reference plate at a set incident angle; measuringthe terahertz wave energy reflected by the reference plate and the material to be measured at the same set incident angle, and calculating the reflectance of the material plate to be measured according to the estimated reflectance of the reference plate; calculating the phase shift caused by the material plate to be measured according to the reflectance and the extrapolated reflectance of the material plate to be measured in the measurement band, and obtaining the complex dielectric parameters of the material plate to be measured. The device and the method suitable for measuring the dielectric parameter of a high reflection material in a terahertz frequency band are based on the terahertz time-domain spectrum technology of the optical fiber coupling, and are particularly suitable for measuring the dielectric parameters of a high reflection material in the terahertz frequency band, and contribute to improve the measurement accuracy of the reflectance and the dielectric parameter.

Description

technical field [0001] The invention relates to the field of terahertz technology, in particular to a device and method for measuring dielectric parameters of highly reflective materials in the terahertz frequency band. Background technique [0002] Terahertz time domain spectroscopy (THz-TDS) is a new spectroscopic technology developed in recent years. The rotation and vibration energy levels of many macromolecular substances fall in the terahertz frequency band. Terahertz time domain spectroscopy The system can be used to measure the absorption spectrum of macromolecular substances such as prohibited chemicals (including various elemental explosives and drugs), and has become an effective means of substance identification; on the other hand, terahertz time-domain spectroscopy is also used as a material property research The tool uses transmission and reflection terahertz time-domain spectroscopy systems to measure the transmittance and reflectance of substances, so as to i...

Claims

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Application Information

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IPC IPC(8): G01R27/26
CPCG01R27/2682
Inventor 蔡禾张景孙金海郑岩张旭涛徐颖
Owner BEIJING INST OF ENVIRONMENTAL FEATURES
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