A Method for Optimizing Structural Parameters of a Non-contact r-test Measuring Instrument
A non-contact, structural parameter technology, used in measuring devices, instruments, electrical devices, etc., can solve the problems of low measurement accuracy and poor measurement sensitivity, and achieve the effect of improving measurement accuracy
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[0110] Such as figure 2 , 3 , 5 and 6, establish a structural model including three non-contact eddy current displacement sensors and a measuring ball 1 uniformly distributed; the three non-contact eddy current displacement sensors are respectively sensor A5, sensor B6 and sensor C7; Such as Figure 4 As shown, the measurement sensitivity index Prec of the non-contact R-test measuring instrument changes with the change of the sensor elevation angle α, monotonically increasing first and then monotonically decreasing. It is determined that when α=33.69°, the measurement sensitivity index Prec reaches the maximum; Based on the measurement sensitivity (take α=33.69°), the relationship between the measurement space S of the non-contact R-test measuring instrument and the sensor center distance λ (r max = 4mm, R 探 = 7mm, R 球 =15mm, δ=4mm) As shown in 8, it is determined that when λ=14mm, the measurement space S is the largest, about 33mm 3 .
[0111] The calculation process o...
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