A method and device for protecting reliability of an electronic device when ionizing particles are bombarded

Abstract

The invention discloses a method and device for protecting the reliability of an electronic device when ionizing particles are bombarded. The method comprises the following steps: S1, calculating theaverage free path of ionizing radiation particles with different energies acting in the electronic device; S2, according to the grade requirement of the radiation protection and the average free pathof the ionizing radiation particles, determining the size and the air pressure value of the gas device required for radiation protection of the electronic device according to the technical node size of the electronic device; S3, placing the electronic device in the gas device and filling neutral gas with preset pressure; S4, reducing the energy flow density of the incident particles by the collision of the incident particles with the neutral gas in the gas device, and protecting the electronic device from damage caused by particle bombardment. Considering that the main external factor of damaging the electronic device is the strength of the ion energy flow, the invention reduces the energy flow density of the incident particles through the arrangement of the gas device and is combined withthe reliability circuit design, thereby protecting the electronic device from the damage caused by the particle bombardment and improving the reliability thereof.

Description

technical field [0001] The invention relates to the field of microelectronic integrated circuits, in particular to integrated circuit chips working in a high-intensity particle flow environment, and in particular to a method and device for protecting the reliability of electronic devices when ionized particles are bombarded. Background technique [0002] In the field of integrated circuit and chip manufacturing, some chips need to work in environments with a lot of particle radiation, such as medical electronics, automotive electronics and aerospace electronics. In these externally irradiated environments, chips can exhibit premature fatigue and damage, leading to chip damage and failure. Contemporary high-performance system-on-chip (SoC) and high-bandwidth memory (HBM) chips are particularly sensitive to various ionizing radiation particles. International semiconductor and integrated circuit companies (such as Microchip / Microsemi, Cypress, Xlinx, etc.) , Anti-radiation pro...

AI Technical Summary

Problems solved by technology

In the prior art, the damage protection of integrated circuit chips is mainly realized by the design of special wiring methods and the adjustment of device structures, which requires a large cost in the design and production of integrated circuits, and the protection effect is not ideal.

At present, there is no technical idea to protect electronic devices from damage caused by particle bombardment by reducing the energy flux density of incident particles and combining reliability design based on the principle of molecular dynamics.

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