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A Calculation Method and Device for Overlapping Community Collection Quality Index

A technology of quality measurement and overlapping communities, which is applied in the computer field, can solve problems such as the inapplicability of the calculation of large-scale community collection quality metrics, and achieve the effect of enriching the quality metrics of overlapping community collections and accelerating the operation speed

Active Publication Date: 2021-10-29
SHENZHEN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The main purpose of the present invention is to provide a method and device for calculating the quality metrics of overlapping community sets, aiming at solving the technical problem that existing algorithms are not suitable for the calculation of large-scale community set quality metrics

Method used

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  • A Calculation Method and Device for Overlapping Community Collection Quality Index
  • A Calculation Method and Device for Overlapping Community Collection Quality Index
  • A Calculation Method and Device for Overlapping Community Collection Quality Index

Examples

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Effect test

no. 1 example

[0061] There are two existing calculation methods for calculating the set quality metrics of overlapping communities, including mutul3 (algorithm designed by the proposer of NMI_LFK) and onmi (algorithm designed by the proposer of NMI_MAX). mutul3 can calculate NMI_LFK, and onmi can calculate NMI_LFK and NMI_MAX at the same time. But these algorithms are all serial calculations. Based on this, the present invention proposes a new calculation method MPI-POCMC (MPI-Parallel Overlapping CommunityMetric Computation, a parallel community metric calculation based on the MPI standard), which is a parallel distributed framework algorithm. Compared with existing algorithms, the calculation method of the present invention is faster.

[0062] The flow chart of the calculation method of the non-overlapping community set quality metrics provided by the first embodiment of the present invention can be found in figure 1 , including:

[0063] Step 1. Obtain community set X={X 1 ,X 2 ,...X...

no. 2 example

[0091] The first kind of overlapping community set quality metric calculation device provided by the present invention can be found in image 3 As shown, it includes a processor 301, a memory 302 and a communication bus 303, wherein:

[0092] The communication bus 303 is used to realize connection and communication between the processor 301 and the memory 302;

[0093] The processor 301 is configured to execute a community set quality indicator calculation program stored in the memory 302, and the community set quality indicator calculation program includes:

[0094] Obtaining module, used to obtain community set X={X 1 ,X 2 ,...,X K}, Y={Y 1 ,Y 2 ,...,Y K'}, and the vertex set V={v 1 ,v 2 ,...,v n}; the K, K', and n respectively represent the number of elements in the community set X, Y and the vertex set V;

[0095] The processing module is used for according to the vertex set V={v 1 ,v 2 ,...,v n} for each vertex v in i , respectively traversing the community ...

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Abstract

The invention discloses a method and device for calculating the quality index of overlapping community sets. The vertex set V is obtained by acquiring the elements in each community in the community sets X and Y, respectively traversing the community sets X and Y, and recording each vertex v i In the community sets X and Y, all the labels of the communities belong to, get the label sets ListXid[i], ListYid[i], and construct the community label Cartesian product data set DicList[i] of each vertex, and finally get the community label data set ListXid , and then based on the greedy algorithm and load balancing, the elements in the ListXid collection are divided and distributed to each process, and each process calculates the required value of each index, and finally merges the relevant values ​​of each index into a single process for operation, and obtains Metrics about community sets X and Y. The method adopts the parallel distributed computing framework MPICH and uses the counting of the same community label pairs to accelerate the calculation speed of the community set quality metrics. At the same time, the quality metrics can be calculated at the same time through the overlapping community set quality metrics calculation method, which is suitable for large-scale Computation of quality metrics for overlapping community collections.

Description

technical field [0001] The invention belongs to the field of computer technology, and in particular relates to a method and device for calculating an overlapping community set quality measurement index. Background technique [0002] In general, a social network graph can be abstracted as a collection of nodes and edges, where nodes represent individuals in the network, and edges represent certain associations between individuals. The social network graph has a community structure, in which the community is composed of tightly connected nodes in the network graph, and the communities are connected by sparse nodes. Community discovery is to characterize and divide the community structure of a network, and the result of community discovery is called community set. If the nodes in the community set belong to only one community, the community set is called non-overlapping community set, otherwise it is called overlapping community set. It should be understood that the community...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06Q10/06G06Q50/00
CPCG06Q10/06393G06Q50/01
Inventor 冯禹洪吴远诗佘松罗秋明
Owner SHENZHEN UNIV
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