Clamping device for testing equipment

Abstract

The invention discloses a clamping device for testing equipment. The clamping device comprises a frame, a manipulator, a hand wheel speed reducing structure and a sliding structure. The manipulator comprises a reversing structure, an adjustable locking structure and a clamping arm. A clamping structure is mounted at the front end of the clamping arm. The reversing structure comprises a first mounting plate, two connection arms, a first reversing joint and two reversing joints. The hand wheel speed reducing structure comprises a disc-type handle, a speed reducer and a second mounting plate. Theadjustable locking structure comprises a third mounting plate, a fourth mounting plate, a shaft sleeve, a horizontal shaft and a third locking handle. The clamping device has the advantages that thehand wheel speed reducing structure drives the manipulator to translate up and down along the frame through the sliding structure, the clamping arm can rotate on the horizontal plane and the verticalplane by a certain angle without power drive through the three reversing joints and the adjustable locking structure, and 300-400kg of testing equipment can be clamped and fastened through cooperativeclamping of two clamping mechanisms.

Description

technical field [0001] The invention belongs to the technical field of clamping equipment, in particular to a clamping device capable of clamping testing equipment. Background technique [0002] Chip, also known as microcircuit (microcircuit), microchip (microchip), integrated circuit (English: integrated circuit, IC). Refers to silicon chips containing integrated circuits, which are small in size and are often part of computers or other electronic equipment. And the wafer is the most core part of the chip. During the production process of the chip or wafer, it is necessary to perform functional testing, such as chip pins, etc. This kind of testing equipment is relatively heavy, and some weigh 250-350kg. , in order to realize the full automation of the testing process, a special feeding system is often used to send the chips and circuit boards to be tested to the testing equipment, and during the testing process, the chips and circuit boards to be tested are located under t...

AI Technical Summary

Problems solved by technology

[0003] The clamping force of the manipulator of the clamping equipment in the prior art is small, and the front end is generally set in the shape of pincers, which are only clamped by the friction force between the pincers and the object to be clamped, which is not suitable for clamping Heavier (such as 100kg, or even more) test equipment, such as the clamping manipulator disclosed in the Chinese patent "A Clamping Manipulator for a Robot" (Application Publication No.: CN 107877495 A), has a complex structure and is not suitable for grasping relatively heavy objects. Heavy test equipment with parallel opposite sides, but complex structure and high manufacturing cost

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