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Segmented exposure imaging highly-dynamic recovery method and system

A restoration method and restoration system technology, applied in the field of image processing, can solve the problems of limited dynamic range of output image, deviation of output value, deviation, etc.

Active Publication Date: 2018-06-29
昆山思特威集成电路有限公司
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AI Technical Summary

Problems solved by technology

[0003] This segmented exposure method limits the high dynamic range due to the flat exposure value in the middle; due to technological reasons, the saturation value V1' of each pixel is not completely consistent, and there will be deviations, resulting in the same light intensity. Next, after passing through the saturation value V1' of each pixel, the output value has a fixed deviation
In addition, the image collected in this way, due to the high dynamic compression in a linear way, makes the dynamic range of the final output image limited

Method used

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  • Segmented exposure imaging highly-dynamic recovery method and system

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Embodiment Construction

[0042] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0043] In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar extensions without violating the connotation of the present invention, so the present invention is not limited by the specific implementations disclosed below.

[0044] see figure 1 , in one embodiment, segmental exposure imaging high dynamic recovery method, comprises the following steps:

[0045] S1: Obtain the brightness value Vli of each pixel at the end exposure time T1 of the first exposure segment and the brightness value Vi of each ...

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Abstract

The invention provides a segmented exposure imaging highly-dynamic recovery method and system. The method comprises the following steps: acquiring brightness values V1i of pixels at a segment end exposure moment T1 of a first exposure segment and brightness values Vi of pixels at a segment end exposure moment T of a second exposure segment, wherein the first exposure segment is earlier than the second exposure segment; calculating a slope value K of a current light intensity corresponding to each pixel point; according to the slope values K and a total exposure time T of the two exposure segment, calculating a current pixel bright value Vxi=K*T of each pixel point; and determining an overexposure comparison range according to an average overexposure value of the first exposure segment, andcarrying out comparative judgment and processing on each pixel brightness value V1i, so that a recovered highly-dynamic image is obtained. The segmented exposure imaging highly-dynamic recovery method and system provided by the invention has the advantages that fixed biases introduced by segmented exposure are eliminated while the highly-dynamic image is recovered, and no additional corrections are needed.

Description

technical field [0001] The present invention relates to the technical field of image processing, in particular to a high dynamic recovery method and system for segmented exposure imaging. Background technique [0002] The exposure method of ordinary image sensors is single-segment exposure, and the dynamic range is relatively small. At present, there is a type of image sensor that uses a segmented exposure method to respond to light in two or more segments, which can improve the dynamic range. see figure 1 , taking two exposures as an example, within the range of the total exposure time T', it is divided into two integration times of 0-T1' and T1'-T', and in the first exposure period 0-T1', the saturated The value is limited to V1' (defined by the manufacturing process), and the exposure is continued in the second exposure time period T1'-T'. For low light, during the period of 0-T1', the exposure value does not reach the saturation value V1', so it is always exposed duri...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N5/235H04N5/353H04N5/355H04N5/232
CPCH04N23/80H04N23/73H04N23/741H04N25/533H04N25/589
Inventor 邵科马伟剑
Owner 昆山思特威集成电路有限公司
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