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A Method for Precise Selection of CCD Signal Sampling Position Based on Visible Light Image

A technology of sampling position and signal sampling, applied in the field of signal processing, can solve the problems of easy deviation of sampling position, easy deformation of waveform, and inability to record internal delay, so as to increase accuracy and stability, reliable waveform and accurate judgment Effect

Active Publication Date: 2020-09-18
BEIJING RES INST OF SPATIAL MECHANICAL & ELECTRICAL TECH
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Problems solved by technology

[0004] The technical problem solved by the present invention is: in view of the problems in the prior art that the internal delay caused by changing the frequency of the CCD signal cannot be recorded, the sampling position is prone to deviation, and the waveform is easily deformed, etc., a CCD signal sampling position based on visible light images is proposed. Accurate selection method to realize accurate selection of CCD sampling position

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  • A Method for Precise Selection of CCD Signal Sampling Position Based on Visible Light Image
  • A Method for Precise Selection of CCD Signal Sampling Position Based on Visible Light Image
  • A Method for Precise Selection of CCD Signal Sampling Position Based on Visible Light Image

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Embodiment Construction

[0047] A method for accurately selecting the sampling position of CCD signals based on visible light images, such as figure 1 As shown, the specific steps are as follows:

[0048] (1) Carry out correlated double sampling to CCD output analog signal, set preset sampling position, obtain the image of different position by changing preset sampling position and store, until all sampling position images in this signal cycle are obtained;

[0049] (2) statistics are carried out to all sampling position images of step (1) gained, calculate the feature value of every image;

[0050] (3) according to step (2) gained each image feature value, draw the complete waveform figure of CCD analog signal in a signal cycle;

[0051] (4) Perform gain control on the CDD camera, observe the change of the CDD analog signal waveform under different gain control conditions, and select the optimal gain control;

[0052] (5) Change the input light of the CDD camera, and repeat steps (2) to (4) under t...

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Abstract

A CCD signal sampling position based on visible light images is accurately selected. Through a complete imaging system, the relationship between the two sampling maintenance of the two sampling of the two sampling techniques is used.The change value, obtain the accurate CCD analog signal information, directly get the working status of the CCD, thereby providing a basis for selecting the sampling position.This method gives the complete waveform of the CCD analog signal within a signal cycle according to the actual camera usage and the changes in the amplitude of the analog signal, so that the selection result is better adaptable.The waveform image is high, and the imaging is good.

Description

technical field [0001] The invention relates to a method for accurately selecting a sampling position of a CCD signal based on a visible light image, belonging to the field of signal processing. Background technique [0002] During the working process of CCD, reset noise is the most important noise interference. Among the processing methods for reset noise, the correlated double sampling technique is relatively easy to implement and widely applicable, and is the most commonly used technique in practical applications. Since the CCD reset noise is unevenly distributed within a signal period, the selection of the sampling position will have a certain impact on the image. In order to reduce the noise and improve the image signal-to-noise ratio, the selection of the sampling position should be in the relatively flat area of ​​the CCD analog signal reference level and signal level respectively. [0003] The traditional sampling position selection method is to observe the phase o...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04N5/372H04N5/357H04N5/217
CPCH04N23/81H04N25/616H04N25/60H04N25/71
Inventor 张斐然李春梅董书莉胡雨婷董方董龙李亮肖龙蔡帅赵斌刘克
Owner BEIJING RES INST OF SPATIAL MECHANICAL & ELECTRICAL TECH
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