Method for improving measuring accuracy of polarization performance of Y waveguide device
A waveguide device, accurate technology, applied in the field of polarization optical device measurement, can solve the problem of chip extinction ratio measurement error, not eliminating measurement error and other problems
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specific Embodiment approach 1
[0055] The specific embodiment one is a method for measuring the extinction ratio of a Y waveguide device chip, and the specific steps are:
[0056] (1) measure the length of the polarization-maintaining pigtail 202 of the randomly selected 45° polarizer 201, denoted as l p , and calculate the optical path corresponding to the fiber, denoted as S p = l p ×Δn b (Δn b is the linear birefringence of the polarization-maintaining pigtail);
[0057] (2) measure the length of the polarization-maintaining pigtail 208 of the randomly selected 45° analyzer 209, denoted as 1 a , and calculate the optical path corresponding to the fiber, denoted as S a = l a ×Δn b ;
[0058] (3) measure and record the input pigtail 204 length l of the Y waveguide device to be tested Y-i , output pigtail 206 length l Y-o , and chip 205 length l Y ;
[0059] (4) Calculate the optical path corresponding to the input pigtail 204, the output pigtail 206, and the chip 205 of the Y waveguide device, ...
specific Embodiment approach 2
[0071] The second specific embodiment is a method for measuring the extinction ratio of a Y waveguide device chip, and the specific steps are:
[0072] (1) measure the length of the polarization-maintaining pigtail 202 of the randomly selected 45° polarizer 201, denoted as l p , and calculate the optical path corresponding to the fiber, denoted as S p = l p ×Δn b (Δn b is the linear birefringence of the polarization-maintaining pigtail);
[0073] (2) measure the length of the polarization-maintaining pigtail 208 of the randomly selected 45° analyzer 209, denoted as 1 a , and calculate the optical path corresponding to the fiber, denoted as S a = l a ×Δn b ;
[0074] (3) measure and record the input pigtail 204 length l of the Y waveguide device to be tested Y-i , output pigtail 206 length l Y-o , and chip 205 length l Y ;
[0075] (4) Calculate the optical path corresponding to the input pigtail 204, the output pigtail 206, and the chip 205 of the Y waveguide devic...
specific Embodiment approach 3
[0087] Specific embodiment three, on the basis of the above-mentioned first or second embodiment, the lengths of the polarization-maintaining pigtails 202 and 208 of the 45° polarizer and the 45° analyzer should meet the requirements of l as far as possible. p ≠l a , and require l p +l Y-i ≠ l a +l Y-o , in order to accurately judge and identify the meaning and position of each characteristic interference peak in the measurement interference signal.
[0088] The polarization performance measurement device of Y waveguide device based on the principle of white light interference is attached figure 2 shown. After the wide-spectrum light source emitted by the light source module 1 passes through the Y-waveguide optical fiber optical path module 2 to be tested, the optical signal with the polarization characteristic of the Y-waveguide enters the scanning Mach-Zehnder interferometer module 3, and the interference signal finally reaches the signal detection and The data proces...
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