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A high-efficiency preparation of high-purity semi-insulating silicon carbide single crystal growth device and method

A silicon carbide single crystal and growth device technology, applied in the direction of single crystal growth, single crystal growth, crystal growth, etc., can solve the problems of increasing equipment cost, increasing the number of processes, increasing operation complexity, and increasing equipment complexity, etc., to reduce The effect of nitrogen impurity content and simple equipment

Active Publication Date: 2020-06-02
CHINA ELECTRONICS TECH GRP NO 46 RES INST
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Problems solved by technology

Although the effect of this device is very obvious when it is used, it also has many disadvantages of increasing equipment cost, increasing equipment complexity, increasing the number of processes and operating complexity

Method used

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  • A high-efficiency preparation of high-purity semi-insulating silicon carbide single crystal growth device and method

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Embodiment Construction

[0030] The present invention will be further described below in conjunction with drawings and embodiments.

[0031]The present invention provides a growth device and method for reducing the content of nitrogen impurities in silicon carbide crystals and preparing high-purity semi-insulating silicon carbide crystals with high efficiency. The specific examples are as follows:

[0032] refer to figure 1 and figure 2 , the high-efficiency preparation of high-purity semi-insulating silicon carbide single crystal growth device of the present invention comprises the insulation system that is made of graphite insulation felt 1, the heating system that is made of induction heating coil 2 and graphite heater 3, is made of graphite crucible 4, SiC powder Source 5, graphite suspender 8, graphite seed crystal support 9, SiC seed crystal 10 constitute the growth system, the growth system of this growth device also includes graphite current limiting cover 6 and graphite flow guide tube 7; a...

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Abstract

The invention discloses a growth device and a growth method for preparing high-purity semi-insulating carbonized silicon single crystals efficiently. The growth method is implemented by the carbonizedsilicon single crystal growth device with a structure of an inert gas graphite flow guide tube and a graphite current-limiting cover. Inertia gases generate forced convection under the action of thestructure, and a forced convection layer is formed on the outer wall of a graphite crucible. When speed and flow of the gas convection are high, influences of diffusion on concentration distribution can be inhibited. In the method, directional movement of the forced convection layer can prevent nitrogen molecules outside the graphite crucible from dispersing into the graphite crucible, so that theproblem that adsorption nitrogen serves as a pollution source in a heat insulating system is solved. According to the method, an inertia-gas atmosphere isolation room system is not needed, and a long-term nitrogen removal process based on furnace vacuumizing is also not needed. The growth device and the growth method have the advantages of high efficiency and equipment simplicity, and can be widely applied to multiple carbonized silicon single crystal furnace systems in the field.

Description

technical field [0001] The invention relates to single crystal growth technology, in particular to a device and method for high-efficiency preparation of high-purity semi-insulating silicon carbide single crystal growth. Background technique [0002] Silicon carbide is a typical wide-bandgap semiconductor material and the third-generation semiconductor material after silicon and gallium arsenide. Compared with silicon and gallium arsenide, silicon carbide materials have excellent properties such as high thermal conductivity, high breakdown field strength, and high saturation electron drift rate, and have great application prospects in high temperature, high frequency, high power, and radiation-resistant devices . Transistors made of semi-insulating silicon carbide can generate power five times the power density of GaAs microwave devices at frequencies up to 10 GHz. Therefore, semi-insulating silicon carbide single crystal is currently the best substrate material for the pr...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C30B29/36C30B23/00C30B33/02
CPCC30B23/005C30B29/36C30B33/02
Inventor 李璐杰徐永宽徐所成张皓张政郭森孟大磊窦瑛
Owner CHINA ELECTRONICS TECH GRP NO 46 RES INST
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