Seabed in situ X fluorescence measurement influence supervision method and device

A fluorescence measurement, in-situ technology, applied in the direction of measuring devices, instruments, scientific instruments, etc., can solve the problems of the accuracy of the detection results and achieve the effect of improving the accuracy

Active Publication Date: 2018-01-16
CHENGDU UNIVERSITY OF TECHNOLOGY
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Problems solved by technology

However, in the submarine X-ray fluorescence detection device, the beryllium window of the detection tube still has a non-negligible impact on the accuracy of the detection results

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  • Seabed in situ X fluorescence measurement influence supervision method and device
  • Seabed in situ X fluorescence measurement influence supervision method and device
  • Seabed in situ X fluorescence measurement influence supervision method and device

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Embodiment Construction

[0060] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. The components of the embodiments of the invention generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations. Accordingly, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without making creative efforts belong to the protection scope of the present invention.

[0061] It should be noted that like numerals and let...

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Abstract

The invention relates to a seabed in situ X fluorescence measurement influence supervision method and device. The method includes the steps: building a Monte Carlo model, and simulating by the Monte Carlo model, to obtain the transmittance of a target element characteristic X ray under a beryllium window containing no impurities and having different thickness; according to the transmittance and with combination of beryllium window security theory analysis results, determining the optimal thickness of the beryllium window; simulating by the Monte Carlo model to respectively obtain the relationships between the target element characteristic X ray intensity and the target element content under conditions that the beryllium window thickness is the optimal thickness and the beryllium window contains impurities and conditions that the beryllium window thickness is the optimal thickness and the beryllium window contains no impurities, and comparing to obtain a comparison result; according tothe comparison result, judging whether the target element characteristic X ray intensity is affected when the beryllium window contains the impurities, and if the target element characteristic X ray intensity is affected when the beryllium window contains the impurities, correcting the target element characteristic X ray intensity when the beryllium window contains the impurities. The seabed in situ X fluorescence measurement influence supervision method provided by the embodiment of the invention effectively improves the accuracy of the measurement result.

Description

technical field [0001] The invention relates to the technical field of seabed detection, in particular to a seabed in-situ X-ray fluorescence measurement influence monitoring method and device. Background technique [0002] Many western countries have successively applied X-ray fluorescence measurement technology to the composition and content analysis of seabed sediments. The in-situ submarine X-ray fluorescence measurement device manufactured by the US Battle team, the device puts the detection tube into the seabed for in-situ measurement, and transmits the detected signal to the transport ship through the cable for analysis. The detection window of the detection tube has a thickness of 0.127 mm of beryllium window composition. However, this sounding tube is only used for measurements up to a depth of 100m. The X-ray fluorescence analyzer of the University of Georgia in the United States is different from the detection method of the Battle team. It obtains the predicted ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/06G01N23/223
Inventor 王广西葛良全李丹赖万昌胡燕翟娟杨强张庆贤谷懿郭成
Owner CHENGDU UNIVERSITY OF TECHNOLOGY
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