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Trench gate structure and manufacturing method thereof

A technology of trench gates and manufacturing methods, which is applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., and can solve problems such as limited applications

Active Publication Date: 2021-05-11
CSMC TECH FAB2 CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, its disadvantage is that it is limited by the technology of trench depth, polysilicon thickness, contact hole depth, etc., which limits the application of this traditional solution.

Method used

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  • Trench gate structure and manufacturing method thereof
  • Trench gate structure and manufacturing method thereof
  • Trench gate structure and manufacturing method thereof

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Embodiment Construction

[0022] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the associated drawings. A preferred embodiment of the invention is shown in the drawings. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the disclosure of the present invention will be thorough and complete.

[0023] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field of the invention. The terms used herein in the description of the present invention are for the purpose of describing specific embodiments only, and are not intended to limit the present invention. As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed items.

[0024] It sho...

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Abstract

The invention relates to a trench gate structure and a manufacturing method thereof. The trench gate structure includes a substrate, a trench on the surface of the substrate, an insulating pad on the substrate, a gate oxide layer on the inner surface of the trench, and a polysilicon gate on the gate oxide layer. The liner is adjacent to the groove through its own slope structure, and the polysilicon gate extends from the groove along the slope structure to the insulating liner, and the insulating liner includes The concave polysilicon gate pull-up region, the polysilicon gate protruding from the trench rides on the polysilicon gate pull-up region. The polysilicon gate in the trench of the present invention is relatively independent from the part extending to the insulating substrate, so the depth of the trench and the depth of the contact hole do not constrain each other. The photolithography step of the polysilicon gate is carried out in the same step as the polysilicon photolithography of the device, and no additional photolithography plate (mask) and photolithography layers are required, so the cost in this aspect will not be increased.

Description

technical field [0001] The invention relates to semiconductor manufacturing technology, in particular to a trench gate structure and a manufacturing method of the trench gate structure. Background technique [0002] Due to cost reasons, traditional trench-type vertical double-diffused metal-oxide-semiconductor field effect transistor (VDMOS) products mostly adopt the method of increasing the end size of the lead-out trench and punching contact holes on it to lead out the trench gate structure. ,Such as figure 1 shown. The advantage of this solution is that it can use the existing mask layer of the product process, without increasing the cost of the mask layer. However, its disadvantage is that it is limited by the technology such as trench depth, polysilicon thickness, and contact hole depth, which limits the application of this traditional solution. Contents of the invention [0003] Based on this, it is necessary to provide a relatively more flexible trench gate struc...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/28H01L29/40H01L29/423H01L29/78
CPCH01L21/28008H01L21/28017H01L29/4236H01L29/7802H01L29/42376H01L29/4238H01L29/66704H01L29/66734H01L29/7813H01L29/7825H01L21/0337H01L21/76897H01L29/42364
Inventor 卞铮
Owner CSMC TECH FAB2 CO LTD
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