Accurate retrieval method for target on the basis of deep metric learning
A technology for measuring learning and goals, which is applied in the fields of instruments, computing, and electrical digital data processing, etc., can solve problems such as low performance and dependence, and achieve high retrieval performance, robust features, and improved retrieval accuracy
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[0049] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are the Some, but not all, embodiments are invented.
[0050] combine figure 1 As shown, the target accurate retrieval method based on deep metric learning in the embodiment of the present invention includes:
[0051] Step A01, in the iterative training of the deep neural network structure, during the process of processing the extracted features of multiple pictures of the same target object, the feature distance of the same category of target objects is reduced, and the feature distance of different categories of target objects is increased , the feature distance of target objects with different class labels is greater than the ...
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