A method for neutron radiation environmental monitoring using sram memory
An environmental monitoring and memory technology, applied in the field of radiation detection, can solve the problems of large measurement errors and radioactivity, and achieve the effects of easy implementation, low cost and high measurement accuracy
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[0026] The single event effect is the ionizing radiation damage effect caused by the interaction of a single ray particle with the sensitive area of the microelectronic device. The single event effect can cause the stored data of the digital circuit to flip and cause the electronic system to malfunction. With the improvement of semiconductor process integration, the characteristic process dimensions of CMOS process integrated circuits have been continuously reduced, and they have become more and more sensitive to single event effects. Although the single event effect has a serious impact on the reliability of the electronic system, because the single event effect is a random effect, its linear and thresholdless effect characteristics can be used to monitor the particle beam in the radiation environment.
[0027] According to the characteristics of the single event effect, it can be roughly divided into two categories: non-destructive and destructive. The former is called the so...
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