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Device and method for measuring contact angle of solid surface based on ultrahigh vacuum condition

A technology of ultra-high vacuum and measuring devices, which is applied in the direction of measuring devices, surface/boundary effects, instruments, etc., can solve the problems of sample contact angle influence and inaccurate measurement, and achieve the effect of easy maintenance, simple design and easy realization

Inactive Publication Date: 2017-06-09
DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although existing devices can accurately measure the contact angle of the sample surface in an atmospheric environment, this measurement technique cannot accurately measure the surface contact angle of some clean samples prepared in ultra-high vacuum, because the sample in ultra-high vacuum During the exposure to the atmosphere, impurities such as hydrocarbons, carbon oxides, and dust in the atmospheric environment will be adsorbed to the surface of the sample in a very short time, which will have a greater impact on the contact angle of the sample

Method used

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  • Device and method for measuring contact angle of solid surface based on ultrahigh vacuum condition
  • Device and method for measuring contact angle of solid surface based on ultrahigh vacuum condition
  • Device and method for measuring contact angle of solid surface based on ultrahigh vacuum condition

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Effect test

Embodiment 1

[0060] This device can directly measure the contact angle of the clean surface of the sample in ultra-high vacuum.

[0061] This measurement device based on the contact angle of the solid surface under ultra-high vacuum conditions is used to connect with the ultra-high vacuum system, and the clean samples prepared in the ultra-high vacuum system (such as graphene / Pt(111), BN / Pt(111), FeO / Au, etc.) can be directly transferred to the device through the sample transfer rod, close the gate valve of the device and ultra-high vacuum, and pass high-purity inert gas (99.999%) into the device through the inlet valve to an atmospheric pressure , open the liquid inlet valve, inject liquid through the liquid inlet gun, and form a microliter-level suspended droplet at the tip of the capillary, turn the linear drive to raise the sample stage, and wait until the droplet at the tip of the capillary touches the surface of the sample, Then adjust the linear drive to lower the sample stage, and ...

Embodiment 2

[0063] The device can independently measure the contact angle of samples under the protection of high-purity inert gas.

[0064] Although this device can be connected with the ultra-high system, it is also a system that can independently complete the test of the contact angle of the sample. The measurement method and process of the contact angle of the sample surface under the condition of high-purity inert atmosphere are as follows:

[0065] Open a horizontal glass window of the device, place the sample to be tested on the sample stage with tweezers, replace the new copper gasket and reinstall the glass window just opened, so that the device is in a sealed state.

[0066] Turn on the exhaust unit, and close the valve between the exhaust unit and the cavity when the vacuum unit has pumped the internal vacuum of the device to a level of 10-6mbar or lower.

[0067] Open the inlet valve, and feed high-purity inert gas into the device to an atmospheric pressure.

[0068] Open th...

Embodiment 3

[0072] The device can be used as an existing contact angle measuring device, and can independently measure the contact angle of a sample surface in an atmospheric environment.

[0073] The measurement method and process of the contact angle of the sample surface under atmospheric conditions are as follows:

[0074] Open a horizontal glass window of the device, and place the sample to be tested on the sample stage through tweezers.

[0075] Open the liquid inlet valve, inject liquid through the liquid inlet gun, and form a microliter-level suspended droplet at the needle tip of the capillary, turn the linear drive to raise the sample stage, wait until the small droplet at the capillary needle tip touches the sample surface, and then Adjusting the linear drive lowers the sample stage, allowing the droplet to transfer from the capillary tip to the sample surface.

[0076] Adjust the height of the sample surface so that the sample surface and the CCD maintain the same height, and...

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Abstract

The invention relates to a device and method for measuring a contact angle of a solid surface based on an ultrahigh vacuum condition. According to the device, one end of a closed system formed by a metal cavity is connected with an ultrahigh vacuum system through a gate valve, and is used for controlling pumping and inflating the device; two opposite windows are formed in the cavity, and droplets on a sample surface can be imaged; a full-scale vacuum meter is connected on the cavity, and the vacuum degree of the cavity can be detected; a sample transfer rod is arranged in the cavity, and is used for transferring a sample between the device and the ultrahigh vacuum system; a sample table is arranged in the cavity, and is used for loading a sample; a capillary tube with a liquid inlet valve is arranged in the cavity, and is used for regulating microliter-grade droplets; a light source and a CCD camera are arranged outside the cavity, and are used for imaging droplets through the windows; a liquid inlet gun arranged outside the cavity realizes droplet microliter-grade regulation together with the capillary tube; and an air extracting unit arranged outside the cavity is used for pumping the cavity.

Description

technical field [0001] The present invention is a kind of based on ultra-high vacuum condition (10 -9 -10 -11 mbar) solid surface contact angle measuring device, the device is used to connect with the ultra-high vacuum system, and the sample in the ultra-high vacuum system is transferred to the device to realize the measurement of the contact angle of the clean sample surface in a high-purity inert atmosphere. Applicable sample requirements can be adapted to the ultra-high vacuum system, have a smooth surface, and will not react with liquids. Such as single crystal, metal flake, thin film, etc. At the same time, the device is also suitable for the contact angle measurement of the sample surface under the condition of atmospheric environment or high-purity inert gas. Background technique [0002] The contact angle refers to the angle θ between the tangent line of the gas-liquid interface made at the intersection of gas, liquid and solid, passing through the liquid and soli...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N13/00
CPCG01N13/00G01N2013/0208
Inventor 傅强吴昊包信和
Owner DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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