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Quick two-dimensional uniform irradiation scanning method

A scanning method and uniform irradiation technology, applied in the field of fast two-dimensional uniform irradiation scanning, to solve the problem of scanning uniformity, improve the scanning speed, and expand the scanning area

Active Publication Date: 2017-05-31
UNIV OF SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] The purpose of the present invention is to provide a fast two-dimensional uniform irradiation scanning method, thereby solving the problem of rapid and uniform irradiation of large-area samples in the prior art

Method used

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  • Quick two-dimensional uniform irradiation scanning method

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specific example

[0035] The example of the present invention adopts the electron beam current that 10MeV microwave electron accelerator produces, and the micropulse repetition frequency of its electron beam is 2856MHz, and macropulse length is 15μs, and macropulse repetition frequency is 500Hz, utilizes the radiation scanning method that the present invention provides, realizes A square sample of 1 square meter at a distance of 5.74 meters from the scanning magnet was uniformly irradiated with a 45-degree oblique incidence.

[0036] The component distribution of the electron beam transmission beam expansion unit is as follows: figure 2 As shown, the total length of the beamline is 13.21 meters, and the main components include 10 quadrupole magnets, 1 secondary magnet, 1 linear scanning magnet and 1 step scanning magnet. The beam is deflected in the vertical direction (y), the initial beam envelope function is β=5m, α=-0.5, and the transverse normalized emittance is ε n = 10πmm-mrad, longitud...

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Abstract

The invention discloses a quick two-dimensional uniform irradiation scanning method. The method comprises the following steps: expanding charged particle beams into beam current which is specifically distributed in section and has a certain width-height ratio; calculating out single-time line canning time according to the macro pulse length of the beam current; calculating out time intervals of single-time stepping scanning according to the repetition frequency of micro pulse of the beam current; carrying out calculating according to sample and beam spot area needing to be scanned to obtain time for finishing one-time surface scanning; deflecting the beam current at an outlet of the beam current by adopting a linear change fast-changing magnetic field according to the calculated line scanning time to realize line scanning of a first dimension; deflecting the beam current at the outlet of the beam current by adopting a quick-response steady-state magnetic field according to the calculated stepping scanning time to realize stepping scanning of a second dimension; adopting a ceramic vacuum chamber at a scanning magnet; supplying power to the scanning magnet by adopting a digital power supply. The method disclosed by the invention has the advantages of high scanning speed, large scanning area, high scanning uniformity and the like.

Description

technical field [0001] The invention belongs to the field of radiation accelerators, in particular to a fast two-dimensional uniform radiation scanning method. Background technique [0002] Irradiation accelerators are widely used in the fields of industry, agriculture, medical care, sanitation, and environmental protection. They are used for the modification of organic materials, disinfection and sterilization of food and medical and sanitary products, and delaying the germination of agricultural products. According to the time period, no nuclear waste, no harm to the environment and other characteristics. The principle of the electron irradiation linear accelerator is that the electron beam of a certain energy is generated by the electron gun, and after being accelerated to high energy, the transport line is adjusted, and under the control of the scanning system, it is irradiated to different parts of the sample. The irradiation scanning system is a very critical componen...

Claims

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Application Information

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IPC IPC(8): H05H7/00G01N1/28
Inventor 杨永良王琳何志刚
Owner UNIV OF SCI & TECH OF CHINA
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