Film magnetic characterization instrument under vacuum

Abstract

The invention discloses a film magnetic characterization instrument under vacuum. The instrument includes an ultra-fast laser, beam splitters, a time delay line, reflectors, a polarization splitting prism, a frequency multiplier, two optical filters, at least one rectangular prism, an optical chopper, an optical focusing lens group, a multi-fiber sample rack, a hermetic vacuum cavity, a 1 / 2 slide, a beam splitter prism, a photodiode, a phase-locked amplifier, a magnet, a constant temperature apparatus, a translation stage, and an imaging apparatus. According to the invention, the instrument, by implementing in situ characterization in the preparation of films, increases measuring efficiency and precision. The instrument can achieve imaging effects by preparing a multi-fiber sample adjusting apparatus with as high as five fibers in combination with the translation stage for samples. Co-axial and vertical incidence of pump and detection beams simplifies light paths and reduces the difficulty in adjusting light paths. In addition, the instrument can enable samples to conduct magnetic characterization inside the vacuum cavity and prevents air or water vapor from polluting the samples.

Description

technical field [0001] The invention relates to a thin-film magnetic characterization instrument in a vacuum environment, in particular to an instrument construction scheme for realizing thin-film magnetic characterization in a vacuum environment based on the magneto-optical Kerr effect, and belongs to the technical fields of condensed matter physics and information storage. Background technique [0002] In recent years, magnetic storage devices based on spintronics have opened up a new information age of big data, cloud computing and high-speed search engines. As an emerging interdisciplinary subject of condensed matter physics, microelectronics and material science, spintronics uses the spin properties of electrons to design electronic devices, and the interface between ferromagnetic materials and other materials is one of the important research directions in this field. At the same time, in the magnetic ultra-thin multilayer film system, the magnetic properties of each la...

AI Technical Summary

Problems solved by technology

[0004] It is difficult to adjust the optical path of the existing public technical solutions, and it is impossible to perform magnetic characterization during the thin film preparation process. At the same time, because the sample cannot be guaranteed to be in a constant temperature state during the test process, it is not suitable to use a laser with a high repetition rate (MHz level) as the pump laser. source

Therefore, the measurement efficiency of the existing test system is low, and it is impossible to obtain large-area data of the sample in a short period of time

In particular, the test environment exposed to air cannot protect samples whose surface materials are easily oxidized. If the measurement system is equipped with a vacuum chamber, there is no good solution for shock absorption.

Images