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Portable X-ray diffractometer

An X-ray and diffractometer technology, applied in the field of X-rays, can solve the problems of difficult stress testing, low precision, and limited penetration depth, etc., and achieve the effect of fast and accurate control of diffraction angle measurement and precise control

Inactive Publication Date: 2016-04-20
MATERIAL INST OF CHINA ACADEMY OF ENG PHYSICS +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] 2. Usually semi-closed-loop stepper motor control is used, and the precision is not high;
[0008] 4. The penetration depth is limited, and it is difficult to achieve stress testing at different depths

Method used

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Embodiment Construction

[0036] The present invention will be further described below in conjunction with accompanying drawing.

[0037] See figure 1 , the X-ray diffractometer of the present invention mainly includes multi-axis manipulator 8, transmission measuring head 7, X-ray tube 1, entrance aperture 2 when doing transmission experiment; wherein receiving aperture 4, X-ray detector 5, The laser alignment instrument is installed on the arc-shaped guide rail of the transmissive measuring head 7a, and the measuring head is installed on the end rotating shaft of the manipulator.

[0038] See figure 2 , image 3 , the X-ray diffractometer of the present invention mainly includes a multi-axis manipulator 8 and a reflective measuring head 7b when doing reflective experiments. Wherein the X-ray tube 1, the X-ray detector 5, and the laser range finder are all installed on the reflective measuring head 7b, and the reflective measuring head 7b is installed on the end rotating shaft of the manipulator. ...

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Abstract

The invention discloses a portable X-ray diffractometer which comprises an X-ray tube, an incident diaphragm, a reflective measuring head, a transmissive measuring head and a receiving diaphragm. The portable X-ray diffractometer is characterized in that the measuring heads are mounted on a multi-shaft mechanical hand; a detector and a light tube are mounted on the reflective measuring head; an angular instrument and a detector are mounted on the transmissive measuring head. A to-be-measured workpiece or sample is unmoved, and the measuring head is driven by the mechanical hand to conduct scanning motion on the to-be-measured workpiece in space to finish measurement. The portable X-ray diffractometer can quickly and accurately control the position and the angle of the measuring head and accurately measure the diffraction angle under the condition that the to-be-measured workpiece is unmoved, can use the X-ray tube of a conventional metal target to measure the diffraction spectrum by adopting a reflective diffraction light path, and can also use the X-ray tube of a heavy metal target to measure the diffraction spectrum by adopting a transmissive diffraction light path.

Description

technical field [0001] The invention belongs to the technical field of X-rays, in particular to a portable X-ray diffractometer capable of precisely controlling a measuring head to scan a space track. Background technique [0002] Common X-ray diffractometers use conventional mechanical mechanisms to fix the target and light pipes, and rely on stepping motors to control the movement of the mechanical structure for scanning testing. The X-ray tube and detector are used to collect the diffraction spectrum. The targets are generally Cr targets, Cu targets, Fe targets, Ag targets, Mo targets, etc., and the working voltage usually does not exceed 50kV. The characteristic X-rays ( Kα) has a long wavelength of 0.07nm~0.29nm, which leads to a shallow penetration depth of X-rays to the sample, about 10μm, making it difficult to obtain information on the phase, texture and stress distribution inside the material. The use of heavy metal target X-ray tubes, such as W target or U target...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/207
CPCG01N23/207
Inventor 张鹏程李云陈力窦作勇马策谈笑王旻董平朱旭马培培
Owner MATERIAL INST OF CHINA ACADEMY OF ENG PHYSICS
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