Heavy ion irradiation testing system for signal processing platform

Abstract

The invention provides a heavy ion irradiation testing system for a signal processing platform. The system comprises a host computer which is used for data receiving, processing, storing and displaying and test process control, a power supply management unit which comprises a programmable power supply, an FPGA+DSP signal processing unit and a manage test unit. The programmable power supply is connected with the host computer, is used for powering the whole system, and feeds back the current of the system and devices to the host computer. The FPGA+DSP signal processing unit is used as a typical space application load signal processing platform, wherein FPGA is SRAM-FPGA and is used as a tested unit of a heavy ion irradiation test. The manage test unit comprises an FPGA and is used for system configuration, data acquisition and exceptional control in the test process. The system provided by the invention has the advantages of flexible architecture, flexible tested object, multiple test items, fast data transmission and the like.

Description

technical field [0001] The invention mainly relates to the field of signal processing platforms, in particular to a heavy ion irradiation test system for signal processing platforms. Background technique [0002] With the shrinking of CMOS process size, integrated circuits working in space environment are more and more seriously affected by failure problems caused by single event errors. Future data relay satellites, broadband communication satellites, remote sensing satellites, radio reconnaissance satellites, navigation satellites, and early warning satellites all need powerful on-board processing platforms (OPP, On-board Processing Platforms) to ensure space support capabilities. These on-board processing platforms It is mainly built with FPGA, DSP, ADC, DAC and other chips as the main components. And these large-scale integrated circuit devices, especially SRAM-FPGA and DSP are very susceptible to the influence of space single event effect. The existence of single even...

AI Technical Summary

Problems solved by technology

[0004] At present, the test system for a single chip has appeared, but the ability of the test system to monitor the test process and test the relevant phenomenon parameters is still not enough

Most of the test systems can only test a single chip, but are lacking in testing the single event response of the entire system, or testing the impact of a single chip single event effect on the system; moreover, these test systems may need to be re-tested for each test. Replace the chip, redesign the architecture, the test system architecture is not flexible enough, and does not have a perfect multi-functional architecture

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