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Interferometer used for spectrograph

A technology of spectrometer and interferometer, applied in the field of spectrometer, can solve the problems affecting the compactness of the instrument, the movement error of the moving mirror and the fixed mirror bracket, the large size of optical components and related volumes, etc., and achieve the effect of eliminating optical path imbalance

Active Publication Date: 2015-06-17
TIANJIN TONGYANG TECH DEV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the optical path system designed in this patent requires multiple additional mirrors and increases the effective path length of the entire optical path. The adverse consequence is that the instability of the optical path caused by thermal changes is significantly increased, and the optical elements and related structures Larger size affects the compactness of the entire instrument
[0012] To sum up, the principles of linear moving mirror scanning and rotating mirror scanning used in interferometers in Fourier transform spectrometers so far have their own characteristics, but they all have poor stability, high requirements for rotating mirror materials, and "crawling" of linear slideways. "The optical path imbalance caused by each other, the motion error of the independent moving mirror and the fixed mirror bracket, the non-uniform mechanical wear caused by the inherent commutation dead point of the linear reciprocating motion and the swinging reciprocating motion, the optical path structure is not easy to install and adjust, etc.

Method used

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  • Interferometer used for spectrograph
  • Interferometer used for spectrograph
  • Interferometer used for spectrograph

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Embodiment approach

[0041] figure 1 As shown, it is the first embodiment of the present invention. In this embodiment: the moving mirror and the fixed mirror are composed of two reflection surfaces of a double-sided plane mirror respectively, and the first and third plane mirrors and the first The hollow corner reflector and the second and fourth plane reflectors are respectively placed on the two outer sides of the double-sided plane reflector, and the reflector is located at the outer end of the double-sided plane reflector close to the first and second plane reflectors The rotation is fixed on the support, and the shaft axis constituting the rotation connection is vertically arranged with the normal line of the moving mirror and the fixed mirror.

[0042] Specific as figure 1 As shown, the structure 1 in the figure is a double-sided coated parallel plane mirror (double-sided plane mirror) as a combination of moving mirror and fixed mirror, which can swing around the swing center 2. 3 is a 50...

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Abstract

The invention discloses an interferometer used for a Fourier transformation spectrograph. The interferometer comprises a spectroscope, a third plane mirror, a fourth plane mirror, a movable mirror and a fixed mirror, wherein the movable mirror and the fixed mirror are arranged on light beam paths between the spectroscope and the third plane mirror as well as between the spectroscope and the fourth plane mirror respectively. The movable mirror and the fixed mirror are designed to be of an integrated structure capable of synchronously swinging or rotating. The interferometer can fundamentally eliminate optical path detuning caused by movement errors of a movable mirror bracket and a fixed mirror bracket independent of the movable mirror bracket. The precision and stability of the interferometer in the Fourier transformation spectrograph are improved, and a larger optical path difference can be obtained under the same swinging or rotating angle.

Description

technical field [0001] The invention relates to the field of spectrometers, in particular to an interferometer for Fourier transform spectrometers. Background technique [0002] Fourier transform spectrometer has the advantages of high wavelength accuracy, fast scanning speed, high spectral resolution, high signal-to-noise ratio, low detection limit, large luminous flux, multi-channel simultaneous detection, etc. It is widely used in material detection and non-destructive measurement research , is playing an increasingly important role in the fields of production, life and scientific research, especially in many industries such as industry, agriculture, geological and mineral exploration, environmental protection, transportation, and medical treatment. [0003] The Fourier transform spectrometer is based on Michelson interference and Fourier transform technology. The main components of the system include light source, beam splitter, interferometer, photoelectric detector, el...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/45
Inventor 徐可欣李晨曦
Owner TIANJIN TONGYANG TECH DEV
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