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Video decoding chip testing device and method

A technology of video decoding and testing methods, which is applied in the field of video decoding chip testing devices, can solve the problems of increased signal processing complexity, large data volume, high bandwidth requirements, etc., and achieve the effect of reducing test complexity and improving test efficiency

Active Publication Date: 2015-01-28
HANGZHOU SILAN MICROELECTRONICS
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Problems solved by technology

[0005] However, there are difficulties when applying the above-mentioned logic analyzer or video analyzer to a video decoder chip containing channels of multiple composite video streams
The signal complexity of multiple composite video streams is high and the amount of data is large
If multiple composite video streams are provided directly to a logic analyzer or video analyzer, this not only results in high bandwidth requirements for the logic analyzer or video analyzer, but also increases signal processing complexity
For example, if the logic analyzer is a PCI bus, it may not be able to successfully receive test data due to bandwidth limitations
Therefore, expensive dedicated logic analyzers or video analyzers must be used in the testing of multiple composite video streams

Method used

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  • Video decoding chip testing device and method
  • Video decoding chip testing device and method
  • Video decoding chip testing device and method

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Embodiment Construction

[0030] The present invention is described below based on examples, but the present invention is not limited to these examples only. In the following detailed description of the invention, some specific details are described in detail. The present invention can be fully understood by those skilled in the art without the description of these detailed parts. Well-known methods, procedures, procedures, components and circuits have not been described in detail in order to avoid obscuring the essence of the present invention.

[0031] Furthermore, those of ordinary skill in the art will appreciate that the drawings provided herein are for illustrative purposes and are not necessarily drawn to scale.

[0032] Unless clearly required by the context, words such as "including", "comprising" and the like throughout the specification and claims should be construed in an inclusive rather than an exclusive or exhaustive sense; that is, "including but not limited to" meaning.

[0033] fi...

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Abstract

The invention provides a video decoding chip testing device and method. A video decoding chip outputs multiple composite video signals. The testing device comprises a video signal processing device used for processing the multiple composite video signals to obtain a single standard video signal, and a video signal analyzing device used for measuring the single standard video signal to obtain the parameter indexes of the video signal. By the adoption of the testing device, testing complexity is effectively reduced, and testing efficiency is improved.

Description

technical field [0001] The invention relates to the field of integrated circuit testing, and more particularly to a video decoding chip testing device and method. Background technique [0002] With the advancement of semiconductor technology and production process, the processing performance of video codec chips is gradually improving, and the image clarity is also getting higher and higher. The performance of video chips is gradually developing from SD to HD. [0003] The testing of video codec integrated circuits is more complex than the testing of other types of integrated circuits in terms of signal processing complexity, signal processing speed, and processing data volume. Under the background of continuous pursuit of transmission speed and channel utilization, most video decoding chips have the feature that one channel can transmit multiple composite video streams at the same time. [0004] For the test of video decoding chips, the usual test method is to use a dedic...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N17/00H04N21/442
Inventor 潘子升宋斌俊魏建中
Owner HANGZHOU SILAN MICROELECTRONICS
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