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Precision laser wavelength measurement device and precision laser wavelength measurement method

A laser wavelength, accurate measurement technology, applied in the measurement device, measurement optics, optical radiation measurement and other directions, can solve the problems of poor measurement stability, large error, low laser wavelength accuracy, etc., to achieve high accuracy, simple structure, Easy-to-use effects

Inactive Publication Date: 2014-12-24
SHANXI UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In order to solve the technical problems such as low accuracy, large error and poor measurement stability of laser wavelength measurement in the current stage, the present invention provides a device and method for accurately measuring laser wavelength

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  • Precision laser wavelength measurement device and precision laser wavelength measurement method
  • Precision laser wavelength measurement device and precision laser wavelength measurement method
  • Precision laser wavelength measurement device and precision laser wavelength measurement method

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Embodiment Construction

[0021] A device for accurately measuring the laser wavelength, comprising a femtosecond pulse laser 28, a PPLN crystal 22 sequentially located on the outgoing optical path of the femtosecond pulse laser 28, a photonic crystal fiber 23, a first convex lens 24, a first attenuation sheet 25 and a first Half-wave plate 18; Also comprise diaphragm 3, the second attenuation plate 2, the second half-wave plate 5, the first polarization beam splitter 6, the 3rd half-wave plate 17 and the second on the optical path of the laser to be measured in sequence Polarizing beam splitter 16; The first polarizing beam splitter 6 is also positioned on the outgoing optical path of the first half-wave plate 18; The position of the first half-wave plate 18 and the first polarizing beam splitter 6 should ensure that the first half-wave plate The optical path of the laser light emitted by 18 after being reflected by the first polarizing beam splitter 6 coincides with the optical path of the laser light...

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Abstract

The invention relates to wavelength measurement techniques, in particular to a precision laser wavelength measurement device and a precision laser wavelength measurement method. The precision laser wavelength measurement device comprises a femtosecond pulse laser, a PPLN (periodically poled lithium niobate) crystal, photonic crystal fibers, a first convex lens, a first attenuator, a first half-wave plate, a diaphragm, a second attenuator, a second half-wave plate, a first polarization beam splitter, a third half-wave plate and a second polarization beam splitter. The PPLN crystal, the photonic crystal fibers, the first convex lens, the first attenuator and the first half-wave plate are sequentially positioned on an emergent light path of the femtosecond pulse laser; the diaphragm, the second attenuator, the second half-wave plate, the first polarization beam splitter, the third half-wave plate and the second polarization beam splitter are sequentially positioned on a to-be-measured laser path. An emergent light path of the second polarization beam splitter is provided with a reflection grating, and a second convex lens, an optical filter, a third convex lens, a third attenuator and an avalanche diode detector are sequentially arranged on a reflection light path of the reflection grating; a spectrometer is connected to a signal output end of the avalanche diode detector. The precision laser wavelength measurement device and the precision laser wavelength measurement method have the advantages of simple structure, simplicity and convenience in operation, easiness in adjustment, low external disturbance, high stability and extremely high precision.

Description

technical field [0001] The invention relates to wavelength measurement technology, in particular to a device and method for accurately measuring laser wavelength. Background technique [0002] With the development of modern science and technology, the measurement of laser wavelength occupies an increasingly important position in metrology, information science, communication, astronomy and other fields, and has always been a hot spot at home and abroad. It is very important to improve the accuracy of laser wavelength measurement. significance. As the measurement reference value, laser wavelength is widely used in the measurement of length, angle, flatness, straightness and perpendicularity, etc. It is the key to ensure measurement accuracy and value traceability. Therefore, the research on laser wavelength measurement equipment has wide applicability and development prospects, and the improvement of laser wavelength measurement accuracy will also improve the accuracy of rel...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J9/00G01J9/04
Inventor 曹书凯张一驰汪丽蓉向少山
Owner SHANXI UNIV
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