Test data automatic generation device and test data automatic generation method
A technology for testing data and data, applied in the field of data processing, which can solve problems such as test data not meeting business meaning, incomplete test path coverage, and missing test points.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0117] Such as image 3 Shown is a structural diagram of a device for automatically generating test data provided in this embodiment. The device is composed of a data storage unit 1 , a sample data extraction unit 2 , a data analysis unit 3 , a test path generation unit 4 , a data path generation unit 5 and a test data generation unit 6 .
[0118] The data storage unit 1 is responsible for storing and storing the basic metadata information, metadata relationship, metadata dictionary values and statistical rules, statistical objects and other test objects needed in the process of generating test data, as well as the data obtained from the sample data extraction unit 2. Sample data and basic table data generated by the test data generating unit 6 .
[0119] The sample data extraction unit 2 is responsible for establishing a business model according to the metadata relationship in the data storage unit 1, and extracting production data according to the business model, and stor...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com