Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A phase microscope imaging method based on shws

A technology of phase microscope and imaging method, applied in the field of microscope imaging, which can solve the problems of cumbersome reconstruction process, vibration noise, complex hardware structure, etc.

Active Publication Date: 2016-01-20
ZHEJIANG UNIV
View PDF9 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] Aiming at the above-mentioned technical problems existing in the prior art, the present invention provides a phase microscope imaging method based on SHWS, which solves the problems of complex hardware structure, cumbersome reconstruction process, and noise introduced by vibration

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A phase microscope imaging method based on shws
  • A phase microscope imaging method based on shws
  • A phase microscope imaging method based on shws

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0029] In order to describe the present invention more specifically, the technical solutions of the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0030] Such as figure 1 Shown, a phase microscope imaging method based on SHWS, comprises the following steps:

[0031] (1) For the two cases of not putting the sample and putting the sample, use SHWS to detect and obtain the Hartmanngram corresponding to the light at each angle in the two cases;

[0032] Such as figure 2As shown, the helium-neon laser beam He-Ne (λ=633nm) is first incident on the scanning galvanometer GM. Then, after passing through the lens L1 (f=200mm) and the oil-immersed condenser lens CL (Nikon, NA=1.4) in sequence, it is irradiated onto the sample. A 4f optical system is formed between the GM and the sample. The sample is immersed in a solution with a certain refractive index and placed between two coverslips, which are separa...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
diameteraaaaaaaaaa
refractive indexaaaaaaaaaa
Login to View More

Abstract

The invention discloses a phase microscope imaging method based on an SHWS (Shack-Hartmann Wavefront Sensor). The phase microscope imaging method comprises the following steps: (1) collecting Hartmanngram; (2) calculating mass center distribution; (3) calculating wavefront slope; (4) reconstructing a wavefront phase; and (5) reconstructing a three-dimensional fault refractive index. According to the phase microscope imaging method, the problems of a phase microscope based on an interference method that the establishment of hardware is complicated, and a reconstruction step is complicated and a lot of noises are easily caused by vibration influence can be improved by effectively utilizing the SHWS; compared with an experiment of an existing reconstruction method, the experiment of the method according to the invention has the advantages that the hardware is greatly simplified, the reconstruction step is simplified and the vibration influences are avoided.

Description

technical field [0001] The invention belongs to the technical field of microscope imaging, and in particular relates to a phase microscope imaging method based on SHWS (Shack-Hartmann Wavefront Sensor, Shack-Hartmann Wavefront Sensor). Background technique [0002] In recent years, with the advancement of science and technology, optical microscopy has become a research hotspot for biologists and clinical researchers with its higher spatial resolution, greater imaging depth and the feasibility of non-destructive detection of living cells. It has become an indispensable tool in biology and medical research, and is an important basis for the establishment and development of cytology and cell biology. At present, in cell biology, in addition to ordinary optical microscopes, there are many kinds of microscopes such as fluorescence microscopes, laser confocal microscopes, and phase microscopes. [0003] Among them, phase microscopy techniques include phase contrast microscopy, di...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/41G02B21/00
Inventor 刘华锋黄晨曦
Owner ZHEJIANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com