Direct calibration method for line structured light vision sensor

Abstract

The invention relates to a direct calibration method for a line structured light vision sensor. The method comprises the following steps: establishing a target formed through standard gauge blocks and by utilizing a three-dimensional precision translation bench; projecting structured light plane to the target through the line structured light vision sensor to form feature points on the target; establishing a space coordinate system on the target; collecting target images and extracting the feature points; establishing a search index table including establishing a direct mapping relation between image coordinates of the feature points and space coordinate system coordinates of the feature points; carrying out calibration on the line structured light vision sensor; and based on the image coordinate of a point to be calibrated, searching the space coordinate system coordinate, which is obtained directly or obtained by utilizing a least squares fitting method, of the point in the search index table, so that the direct calibration of the line structured light vision sensor can be realized. The calibration method is used for the line structured light vision sensor which belongs to the small vision field high precision measurement application field. The calibration method is simple and direct, easy to realize, high in precision and can meet the need of measurement.

Description

technical field [0001] The invention belongs to the application field of computer vision technology, and relates to a line structured light vision measurement system, in particular to a line structured light vision sensor calibration method in the application field of small field of view high precision measurement. Background technique [0002] Line structured light vision measurement technology has the characteristics of high measurement accuracy, large amount of information, high sensitivity, good real-time performance, and strong anti-interference ability. It has been widely used in industrial measurement, 3D reconstruction, reverse engineering and other fields. [0003] At present, the traditional calibration methods of line structured light sensors mainly adopt model calibration methods, mainly including target calibration method, differential method, blanking point method, mechanical adjustment method, filament scattering method, cross-ratio invariant method, etc. [0...

AI Technical Summary

Problems solved by technology

[0011] Aiming at the problems of the above-mentioned complex sensor calibration method and low precision, the purpose of the present invention is to propose a simple and fast direct calibration method for line structured light sensors that does not require a calibration model. This calibration method is simple, direct, easy to implement, and has high precision. It can meet the needs of small field of view and high precision measurement

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