Method for detecting insect fragments in wheat flour based on Terahertz time domain spectra

Abstract

The invention discloses a method for detecting insect fragments in wheat flour based on Terahertz time domain spectra. First, wheat flour samples containing the insect fragments are made and divided into a correcting sample set and a verifying sample set. The Terahertz time domain spectra of all the samples are collected, Fourier transformation is carried out on obtained time domain spectrum data so as to obtain a Terahertz frequency domain spectrum data group, and a spectral data group of Terahertz absorption coefficients is calculated. The insect fragments in the wheat flour are estimated based on Terahertz absorption spectra in combination with PLSR (Partial-Least-Squares Regression), optimal factor number in the PLSR is determined through the utilization of cross validation, and the rapid detection of the insect fragments in the wheat flour is realized. Modeling is carried out by introducing PLSR in the Terahertz absorption spectra, the problems that the independent variables of the Terahertz spectra are multiple and multiple correlations exist among the independent variables are solved, and the quantitative analysis problem of the Terahertz spectrum data is solved. The method has important practice meaning in ensuring the quality of the flour and sequent food.

Description

technical field [0001] The invention relates to a method for detecting pest fragments in wheat flour, in particular to a method for detecting pest fragments in wheat flour based on terahertz time-domain spectroscopy. Background technique [0002] During grain storage, the harm of stored grain pests is very serious. Stored grain pests are one of the most serious factors that endanger the quality of stored grains and related cereals, including rice, flour, corn, millet, buckwheat and sorghum. Early pests such as corn weevil, rice weevil, grain weevil, grain beetle, bean weevil, wheat moth, etc. eat in the grain, and the eggs, larvae and pupae of these concealed pests inside the grain all grow and develop in the grain , Harm grains in the form of borers. This kind of hidden pests is neither easy to detect nor easy to get rid of. It is the main source of wheat flour pest fragments. The second food pests, Sawgrass, Reds, and Longhorn, can only harm the debris and powder of grai...

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Problems solved by technology

[0004] However, these methods have their own defects: the flotation method needs to use dangerous organic solvents; the iodine solution method will be seriously affected by different iodine solution concentrations, and the iodine solution concentration needs to be controlled in advance; DNA fingerprinting, protein fingerprinting and enzyme Linked immunosorbent assays all rely on complex sample preparation and degradation processes; the soft X-ray method has a large amount of data calculation, the detection method is time-consuming, laborious, difficult to automate or requires expensive special equipment; near-infrared spectroscopy is a Simple, fast, non-destructive testing method, but the detection accuracy is lower than other methods

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