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Semiconductor integrated circuit

A technology of integrated circuits, semiconductors, applied in the field of measures against false attacks

Inactive Publication Date: 2014-03-26
RENESAS ELECTRONICS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] There are fault attacks that exploit the faults of secure microcontrollers for the purpose of obtaining or falsifying, for example, confidential information stored in microcontrollers used to process confidential information

Method used

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  • Semiconductor integrated circuit
  • Semiconductor integrated circuit
  • Semiconductor integrated circuit

Examples

Experimental program
Comparison scheme
Effect test

no. 2 example

[0104]

[0105] figure 2 is an explanatory diagram showing a specific configuration example of a semiconductor device according to the second embodiment. In this configuration example, the error determination circuit 2 is capable of detecting a 1-bit error, and the light detection elements 3_5 to 3_7 are interleaved among the storage elements 5_7 to 5_10 so as to detect laser irradiation to 2-bit or more storage elements.

[0106] The semiconductor device includes an error detection code generating circuit 7 for generating an error detection code based on write data stored in flip-flops 5_7 to 5_10. The error detection code generated by the error detection code generation circuit 7 is stored in the flip-flop 5_11. The check circuit 8 determines the presence or absence of an error based on the data read from the flip-flops 5_7 to 5_10 and the error detection code stored in the flip-flop 5_11 , and outputs an error detection signal if there is an error. Outputs of the light...

no. 3 example

[0115]

[0116] Although the second embodiment utilizes a 1-bit error detection code, the error detection capability is arbitrarily improved. In the case where the error detection capability of the error determination circuit 2 is improved, the light irradiation detection capability of the light irradiation detection circuit 4 is reduced. In the case where the error determination circuit 2 is capable of detecting errors of m bits or less, it is only necessary for the light irradiation detection circuit 4 to have the ability to detect light irradiation to (m+1) or more storage elements. More specifically, one light detection element is provided for m storage elements.

[0117] Figure 4 is an explanatory diagram showing a configuration example in which a semiconductor device according to a third embodiment adopts a 3-bit error detection code.

[0118] The semiconductor device includes an error detection code generating circuit 7 for generating an error detection code based ...

no. 4 example

[0122]

[0123] Figure 5 is an explanatory diagram showing a configuration example for protection by duplexing of a semiconductor device according to the fourth embodiment.

[0124] Write data is written to the flip-flop 5_24 as the active system and the flip-flop 5_25 as the standby system, and the data stored in the flip-flop 5_24 as the active system is read as a protected FF output. The error detection circuit 2 is an exclusive OR gate, and outputs an error detection signal when the data read from the flip-flop 5_24 and the data read from the flip-flop 5_25 do not match.

[0125] The light detection element 3_14 is arranged between a trigger 5_24 as an active system and a trigger 5_25 as a backup system. Based on its output, the light irradiation detection circuit outputs a light irradiation detection signal.

[0126] An attack is detected as a light detection signal when light is irradiated to one of the flip-flops 5_24 and 5_25 as the active and backup systems to in...

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PUM

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Abstract

The invention relates to a semiconductor integrated circuit. Confidential information stored in an LSI can be protected against laser attacks for the purpose of obtaining or forging confidential information through breakdown of the LSI. Laser attacks are detected whatever the number of error bits caused by laser attacks in multi-bit storage elements. Provided is an attack detection circuit for detecting multi-bit storage elements contained in a logic circuit. The attack detection circuit includes an error determination circuit capable of detection through a logic operation such as a code theory and a light irradiation detection circuit having light detection elements, and the light detection elements are arranged so that the light irradiation detection circuit can detect errors of the number of bits beyond the detection limit of the error determination circuit. Due to error detection by the error determination circuit and light irradiation detection by the light irradiation detection circuit, the circuits complementarily detect fault attacks from outside.

Description

[0001] Cross References to Related Applications [0002] The disclosure of Japanese Patent Application No. 2012-206965 filed on September 20, 2012 including specification, drawings and abstract is hereby incorporated by reference in its entirety. technical field [0003] The present invention relates to a semiconductor integrated circuit, and in particular can be suitably applied to measures against false attacks aimed at fraudulently obtaining or falsifying confidential information. Background technique [0004] There is a fault attack that exploits a fault of a secure microcontroller for the purpose of obtaining or falsifying, for example, confidential information stored in a microcontroller for processing confidential information. This fault is caused by application of abnormal voltage or abnormal frequency clock, laser irradiation attack, etc. Laser irradiation attacks cause malfunctions at localized areas, which is extremely threatening in malfunction attacks; therefo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F21/55G06F11/10
CPCG06F21/75H03K19/003G06F11/10G06F21/64G06F21/81G06F21/604G06F21/71G06F2221/034
Inventor 天沼佳幸三好孝典
Owner RENESAS ELECTRONICS CORP
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